Orion Jonathan Pierre MOURAILLE

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Eersel, NL

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Patents Grantslast 30 patents

Information Patent Grant
Alignment mark positioning in a lithographic process
- Patent number 11,294,294
- Issue date Apr 5, 2022
- ASML Netherlands B.V.
- Richard Johannes Franciscus Van Haren
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Patterning stack optimization
- Patent number 10,775,705
- Issue date Sep 15, 2020
- ASML Netherlands B.V.
- Wim Tjibbo Tel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
ALIGNMENT MARK POSITIONING IN A LITHOGRAPHIC PROCESS
- Publication number 20210048758
- Publication date Feb 18, 2021
- ASML NETHERLANDS B.V.
- Richard Johannes Franciscus VAN HAREN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PATTERNING STACK OPTIMIZATION
- Publication number 20190204749
- Publication date Jul 4, 2019
- ASML NETHERLANDS B.V.
- Wim Tjibbo TEL
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY