Orman G. Shofner JR.

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Cedar Park, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Test control point insertion and X-bounding for logic built-in self...
- Patent number 9,547,043
- Issue date Jan 17, 2017
- NXP USA, INC.
- Nisar Ahmed
- G01 - MEASURING TESTING
Information Patent Grant
Functional path failure monitor
- Patent number 9,222,971
- Issue date Dec 29, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Xiaoxiao Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus to data log at-speed March C+ memory BIST
- Patent number 6,944,806
- Issue date Sep 13, 2005
- FREESCALE SEMICONDUCTOR, INC.
- Cinda L. Flynn
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
FUNCTIONAL PATH FAILURE MONITOR
- Publication number 20150121158
- Publication date Apr 30, 2015
- XIAOXIAO WANG
- G01 - MEASURING TESTING
Information Patent Application
TEST CONTROL POINT INSERTION AND X-BOUNDING FOR LOGIC BUILT-IN SELF...
- Publication number 20140258798
- Publication date Sep 11, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Nisar Ahmed
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus to data log at-speed March C+ memory BIST
- Publication number 20030221146
- Publication date Nov 27, 2003
- Cinda L. Flynn
- G11 - INFORMATION STORAGE