Orson Sutherland

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Leiden, NL

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Patents Grantslast 30 patents

Information Patent Grant
Plasma source for a focused ion beam system
- Patent number 9,640,367
- Issue date May 2, 2017
- FEI Company
- John Keller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle extraction device and method of design there for
- Patent number 8,653,474
- Issue date Feb 18, 2014
- FEI Company
- Roderick Boswell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle extraction device and method of design there for
- Patent number 8,405,043
- Issue date Mar 26, 2013
- FEI Company
- Roderick Boswell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle extraction device and method of design there for
- Patent number 7,872,242
- Issue date Jan 18, 2011
- FEI Company
- Roderick Boswell
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Magnetically Enhanced, Inductively coupled Plasma Source For a Focu...
- Publication number 20150130348
- Publication date May 14, 2015
- FEI Company
- John Keller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Extraction Device and Method of Design There for
- Publication number 20130240751
- Publication date Sep 19, 2013
- FEI Company
- Roderick Boswell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Extraction Device And Method Of Design There for
- Publication number 20110100798
- Publication date May 5, 2011
- FEI Company
- Roderick Boswell
- H01 - BASIC ELECTRIC ELEMENTS