Ory Zik

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Tel Aviv, IL

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Patents Grantslast 30 patents

Information Patent Grant
Device and method for the examination of samples in a non vacuum en...
- Patent number 7,253,418
- Issue date Aug 7, 2007
- Yeda Research and Development Co. Ltd.
- Elisha Moses
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for the examination of samples in a non-vacuum en...
- Patent number 6,992,300
- Issue date Jan 31, 2006
- Yeda Research and Development Co., Ltd.
- Elisha Moses
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for the examination of samples in a non vacuum en...
- Patent number 6,989,542
- Issue date Jan 24, 2006
- Yeda Research and Development Co., Ltd.
- Elisha Moses
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanotube-based electron emission device and systems using the same
- Patent number 6,512,235
- Issue date Jan 28, 2003
- El-Mul Technologies Ltd.
- Guy Eitan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Device and method for the examination of samples in a non vacuum en...
- Publication number 20060033038
- Publication date Feb 16, 2006
- Yeda Research and Development Co. Ltd.
- Elisha Moses
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of identification and quantification of biological molecules...
- Publication number 20050244821
- Publication date Nov 3, 2005
- Ory Zik
- G01 - MEASURING TESTING
Information Patent Application
Device and method for the examination of samples in a non vacuum en...
- Publication number 20040217297
- Publication date Nov 4, 2004
- Yeda Research and Development Co. Ltd.
- Elisha Moses
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Device and method for the examination of samples in a non-vacuum en...
- Publication number 20040046120
- Publication date Mar 11, 2004
- YEDA RESEARCH AND DEVELOPMENT CO., LTD.
- Elisha Moses
- H01 - BASIC ELECTRIC ELEMENTS