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Osamu Ariyada
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Tokyo, JP
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last 30 patents
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Patent Grant
Atomic flux measurement device
Patent number
9,658,191
Issue date
May 23, 2017
The Doshisha
Tadashi Ohachi
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Patents Applications
last 30 patents
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Patent Application
PLASMA CHEMICAL VAPOR DEPOSITION DEVICE
Publication number
20160376707
Publication date
Dec 29, 2016
Toyota Jidosha Kabushiki Kaisha
Yoji SATO
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
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Patent Application
ATOMIC FLUX MEASUREMENT DEVICE
Publication number
20130124124
Publication date
May 16, 2013
ARIOS INC.
Tadashi OHACHI
C30 - CRYSTAL GROWTH