Osamu Endoh

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
LSI device having scan separators provided in number reduced from s...
- Patent number 7,373,570
- Issue date May 13, 2008
- Oki Electric Industry Co., Ltd.
- Hiroyuki Hanamori
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LSI device having scan separators provided in number reduced from s...
- Publication number 20060136796
- Publication date Jun 22, 2006
- Hiroyuki Hanamori
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit
- Publication number 20050149798
- Publication date Jul 7, 2005
- Oki Electric Industry Co., Ltd
- Kohtaro Inuzuka
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit
- Publication number 20050138512
- Publication date Jun 23, 2005
- Oki Electric Industry Co., Ltd.
- Kohtaro Inuzuka
- G01 - MEASURING TESTING