Osamu FURUHASHI

Person

Kyoto-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Ion analyzer
- Patent number 12,198,920
- Issue date Jan 14, 2025
- Shimadzu Corporation
- Masaru Nishiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 11,906,449
- Issue date Feb 20, 2024
- Shimadzu Corporation
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer, sampling probe, and analysis method
- Patent number 10,930,488
- Issue date Feb 23, 2021
- Shimadzu Corporation
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Orthogonal acceleration time-of-flight mass spectrometry
- Patent number 10,923,339
- Issue date Feb 16, 2021
- Shimadzu Corporation
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Orthogonal acceleration time-of-flight mass spectrometry
- Patent number 10,573,504
- Issue date Feb 25, 2020
- Shimadzu Corporation
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for analyzing optical isomers using circularly polarized lig...
- Patent number 10,529,549
- Issue date Jan 7, 2020
- Shimadzu Corporation
- Yoshinori Arita
- G01 - MEASURING TESTING
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 10,186,413
- Issue date Jan 22, 2019
- Shimadzu Corporation
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion radiation device and surface analyzer using said device
- Patent number 9,892,902
- Issue date Feb 13, 2018
- Shimadzu Corporation
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer for conducting high resolution mas...
- Patent number 9,613,787
- Issue date Apr 4, 2017
- Shimadzu Corporation
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 9,490,114
- Issue date Nov 8, 2016
- Shimadzu Corporation
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 9,275,843
- Issue date Mar 1, 2016
- Shimadzu Corporation
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 9,048,082
- Issue date Jun 2, 2015
- Shimadzu Corporation
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 8,772,708
- Issue date Jul 8, 2014
- National University Corporation Kobe University
- Tohru Kinugawa
- G01 - MEASURING TESTING
Information Patent Grant
Mass analysis data processing method and mass spectrometer
- Patent number 8,612,162
- Issue date Dec 17, 2013
- Shimadzu Corporation
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-turn time-of-flight mass spectrometer
- Patent number 8,492,711
- Issue date Jul 23, 2013
- Shimadzu Corporation
- Tohru Kinugawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass-analysis method and mass-analysis apparatus
- Patent number 8,097,844
- Issue date Jan 17, 2012
- Shimadzu Corporation
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 7,759,640
- Issue date Jul 20, 2010
- Shimadzu Corporation
- Mitsutoshi Setou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap mass spectrometry
- Patent number 7,582,866
- Issue date Sep 1, 2009
- Shimadzu Corporation
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 7,550,716
- Issue date Jun 23, 2009
- Shimadzu Corporation
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Surface Analysis Method and Surface Analysis Apparatus
- Publication number 20250020603
- Publication date Jan 16, 2025
- Shimadzu Corporation
- Osamu FURUHASHI
- G01 - MEASURING TESTING
Information Patent Application
ION ANALYZER
- Publication number 20220375739
- Publication date Nov 24, 2022
- Shimadzu Corporation
- Masaru NISHIGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20220236200
- Publication date Jul 28, 2022
- Shimadzu Corporation
- Osamu FURUHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER, SAMPLING PROBE, AND ANALYSIS METHOD
- Publication number 20200328071
- Publication date Oct 15, 2020
- Shimadzu Corporation
- Osamu FURUHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20200266046
- Publication date Aug 20, 2020
- Shimadzu Corporation
- Osamu FURUHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ORTHOGONAL ACCELERATION TIME-OF-FLIGHT MASS SPECTROMETRY
- Publication number 20200152441
- Publication date May 14, 2020
- Shimadzu Corporation
- Osamu FURUHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ANALYZING OPTICAL ISOMERS AND ION MOBILITY ANALYZER
- Publication number 20190066992
- Publication date Feb 28, 2019
- Shimadzu Corporation
- Yoshinori ARITA
- G01 - MEASURING TESTING
Information Patent Application
ORTHOGONAL ACCELERATION TIME-OF-FLIGHT MASS SPECTROMETRY
- Publication number 20190019664
- Publication date Jan 17, 2019
- SHIMADZU CORPORATION
- Osamu FURUHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20170358440
- Publication date Dec 14, 2017
- SHIMADZU CORPORATION
- Osamu FURUHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION RADIATION DEVICE AND SURFACE ANALYZER USING SAID DEVICE
- Publication number 20170154764
- Publication date Jun 1, 2017
- Shimadzu Corporation
- Osamu FURUHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20150270115
- Publication date Sep 24, 2015
- SHIMADZU CORPORATION
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20140224982
- Publication date Aug 14, 2014
- SHIMADZU CORPORATION
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20140054456
- Publication date Feb 27, 2014
- Tohru Kinugawa
- G01 - MEASURING TESTING
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20140008531
- Publication date Jan 9, 2014
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Turn Time-of-Flight Mass Spectrometer
- Publication number 20120112060
- Publication date May 10, 2012
- Shimadzu Corporation
- Tohru KINUGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Analysis Data Processing Method and Mass Spectrometer
- Publication number 20110231109
- Publication date Sep 22, 2011
- Shimadzu Corporation
- Osamu FURUHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Time-Of-Flight Mass Spectrometer
- Publication number 20110192972
- Publication date Aug 11, 2011
- SHIMADZU CORPORATION
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20110168883
- Publication date Jul 14, 2011
- Shimadzu Corporation
- Osamu FURUHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY APPARATUS AND METHOD
- Publication number 20090230301
- Publication date Sep 17, 2009
- Shimadzu Corporation
- Osamu furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20090146053
- Publication date Jun 11, 2009
- Shimadzu Corporation
- Mitsutoshi Setou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION TRAP MASS SPECTROMETRY
- Publication number 20090090860
- Publication date Apr 9, 2009
- Shimadzu Corporation
- Osamu FURUHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS-ANALYSIS METHOD AND MASS-ANALYSIS APPARATUS
- Publication number 20090032698
- Publication date Feb 5, 2009
- SHIMADZU CORPORATION
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometer
- Publication number 20070085000
- Publication date Apr 19, 2007
- Shimadzu Corporation
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS

Osamu FURUHASHI

Person

Patents Grantslast 30 patents

Ion analyzer

Mass spectrometer

Mass spectrometer, sampling probe, and analysis method

Orthogonal acceleration time-of-flight mass spectrometry

Orthogonal acceleration time-of-flight mass spectrometry

Method for analyzing optical isomers using circularly polarized lig...

Time-of-flight mass spectrometer

Ion radiation device and surface analyzer using said device

Time-of-flight mass spectrometer for conducting high resolution mas...

Time-of-flight mass spectrometer

Time-of-flight mass spectrometer

Time-of-flight mass spectrometer

Time-of-flight mass spectrometer

Mass analysis data processing method and mass spectrometer

Multi-turn time-of-flight mass spectrometer

Mass-analysis method and mass-analysis apparatus

Mass spectrometer

Ion trap mass spectrometry

Mass spectrometer

Patents Applicationslast 30 patents

Surface Analysis Method and Surface Analysis Apparatus

ION ANALYZER

MASS SPECTROMETER

MASS SPECTROMETER, SAMPLING PROBE, AND ANALYSIS METHOD

MASS SPECTROMETER

ORTHOGONAL ACCELERATION TIME-OF-FLIGHT MASS SPECTROMETRY

METHOD FOR ANALYZING OPTICAL ISOMERS AND ION MOBILITY ANALYZER

ORTHOGONAL ACCELERATION TIME-OF-FLIGHT MASS SPECTROMETRY

TIME-OF-FLIGHT MASS SPECTROMETER

ION RADIATION DEVICE AND SURFACE ANALYZER USING SAID DEVICE

TIME-OF-FLIGHT MASS SPECTROMETER

TIME-OF-FLIGHT MASS SPECTROMETER

TIME-OF-FLIGHT MASS SPECTROMETER

TIME-OF-FLIGHT MASS SPECTROMETER

Multi-Turn Time-of-Flight Mass Spectrometer

Mass Analysis Data Processing Method and Mass Spectrometer

Time-Of-Flight Mass Spectrometer

MASS SPECTROMETER

MASS SPECTROMETRY APPARATUS AND METHOD

MASS SPECTROMETER

ION TRAP MASS SPECTROMETRY

MASS-ANALYSIS METHOD AND MASS-ANALYSIS APPARATUS

Mass spectrometer