Osamu Harakawa

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Magnetic field detection device and magnetic field detection device...
- Patent number 12,188,997
- Issue date Jan 7, 2025
- TDK Corporation
- Makoto Kameno
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field detection device and magnetic field detection device...
- Patent number 12,117,506
- Issue date Oct 15, 2024
- TDK Corporation
- Takato Fukui
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor
- Patent number 12,099,101
- Issue date Sep 24, 2024
- TDK Corporation
- Koji Kuroki
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic head smear detecting method and device
- Patent number 7,026,823
- Issue date Apr 11, 2006
- TDK Corporation
- Kazuaki Takanuki
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
MAGNETIC SENSOR AND ITS MANUFACTURING METHOD
- Publication number 20230288503
- Publication date Sep 14, 2023
- TDK Corporation
- Yuichiro YAMAJI
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD DETECTION DEVICE AND MAGNETIC FIELD DETECTION DEVICE...
- Publication number 20230204686
- Publication date Jun 29, 2023
- TDK Corporation
- Takato FUKUI
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD DETECTION DEVICE AND MAGNETIC FIELD DETECTION DEVICE...
- Publication number 20230176145
- Publication date Jun 8, 2023
- TDK Corporation
- Makoto KAMENO
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20230037194
- Publication date Feb 2, 2023
- TDK Corporation
- Koji KUROKI
- G01 - MEASURING TESTING
Information Patent Application
Magnetic head smear detecting method and device
- Publication number 20040239343
- Publication date Dec 2, 2004
- TDK Corporation
- Kazuaki Takanuki
- G01 - MEASURING TESTING