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Osamu Ichikawa
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Osaka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor integrated circuit and memory test method
Patent number
7,739,563
Issue date
Jun 15, 2010
Panasonic Corporation
Osamu Ichikawa
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor device with a relief processing portion
Patent number
7,539,071
Issue date
May 26, 2009
Panasonic Corporation
Tomohiro Kurozumi
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor integrated circuit and memory test method
Patent number
7,372,251
Issue date
May 13, 2008
Matsushita Electric Industrial Co., Ltd.
Osamu Ichikawa
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor wiring substrate, semiconductor device, method for te...
Patent number
7,348,595
Issue date
Mar 25, 2008
Matsushita Electric Industrial Co., Ltd.
Sadami Takeoka
G11 - INFORMATION STORAGE
Information
Patent Grant
Redundant memory incorporating serially-connected relief informatio...
Patent number
7,315,479
Issue date
Jan 1, 2008
Matsushita Electric Industrial Co., Ltd.
Tomohiro Kurozumi
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor integrated circuit and memory test method
Patent number
7,295,028
Issue date
Nov 13, 2007
Matsushita Electric Industrial Co., Ltd.
Osamu Ichikawa
G11 - INFORMATION STORAGE
Information
Patent Grant
Test method for a semiconductor integrated circuit having a multi-c...
Patent number
7,249,297
Issue date
Jul 24, 2007
Matsushita Electric Industrial Co., Ltd.
Osamu Ichikawa
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor integrated circuit and testing method for the same
Patent number
7,197,725
Issue date
Mar 27, 2007
Matsushita Electric Industrial Co., Ltd.
Sadami Takeoka
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor wiring substrate, semiconductor device, method for te...
Patent number
7,171,600
Issue date
Jan 30, 2007
Matsushita Electric Industrial Co., Ltd.
Sadami Takeoka
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor integrated circuit and test method thereof
Patent number
7,155,643
Issue date
Dec 26, 2006
Matsushita Electric Industrial Co., Ltd.
Osamu Ichikawa
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor wiring substrate, semiconductor device, method for te...
Patent number
7,032,196
Issue date
Apr 18, 2006
Matsushita Electric Industrial Co., Ltd.
Sadami Takeoka
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor integrated circuit and memory test method
Patent number
6,917,215
Issue date
Jul 12, 2005
Matsushita Electric Industrial Co., Ltd.
Osamu Ichikawa
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor device having a device for testing the semiconductor
Patent number
6,734,549
Issue date
May 11, 2004
Matsushita Electric Industrial Co., Ltd.
Sadami Takeoka
G11 - INFORMATION STORAGE
Information
Patent Grant
Database for designing integrated circuit device, and method for de...
Patent number
6,615,389
Issue date
Sep 2, 2003
Matsushita Electric Industrial Co., Ltd.
Mitsuyasu Ohta
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor integrated circuit and method for testing the semicon...
Patent number
6,271,677
Issue date
Aug 7, 2001
Matsushita Electric Industrial Company, Limited
Mitsuyasu Ohta
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Signal Noise Reduction
Publication number
20080306734
Publication date
Dec 11, 2008
Osamu Ichikawa
G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information
Patent Application
Noise reduction device, program and method
Publication number
20080294430
Publication date
Nov 27, 2008
Osamu Ichikawa
G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information
Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND MEMORY TEST METHOD
Publication number
20080215946
Publication date
Sep 4, 2008
Matsushita Electric Industrial Co., Ltd.
Osamu Ichikawa
G11 - INFORMATION STORAGE
Information
Patent Application
Semiconductor device
Publication number
20070280015
Publication date
Dec 6, 2007
Tomohiro Kurozumi
G11 - INFORMATION STORAGE
Information
Patent Application
Semiconductor integrated circuit and testing method for the same
Publication number
20070250284
Publication date
Oct 25, 2007
Matsushita Electric Industrial Co., Ltd.
Sadami Takeoka
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Test pattern generation method
Publication number
20070011543
Publication date
Jan 11, 2007
Shinichi Yoshimura
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor device
Publication number
20060268633
Publication date
Nov 30, 2006
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Tomohiro Kurozumi
G11 - INFORMATION STORAGE
Information
Patent Application
Semiconductor integrated circuit and memory test method
Publication number
20060005095
Publication date
Jan 5, 2006
Matsushita Electric Industrial Co., Ltd.
Osamu Ichikawa
G11 - INFORMATION STORAGE
Information
Patent Application
Semiconductor integrated circuit and memory test method
Publication number
20050216810
Publication date
Sep 29, 2005
Matsushita Electric Industrial Co., Ltd.
Osamu Ichikawa
G11 - INFORMATION STORAGE
Information
Patent Application
Method for testing semiconductor integrated circuit
Publication number
20050204239
Publication date
Sep 15, 2005
Shinya Miyaji
G01 - MEASURING TESTING
Information
Patent Application
Test method for a semiconductor integrated circuit having a multi-c...
Publication number
20050172189
Publication date
Aug 4, 2005
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Osamu Ichikawa
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor integrated circuit and test method thereof
Publication number
20040205427
Publication date
Oct 14, 2004
Matsushita Electric Industrial Co., Ltd.
Osamu Ichikawa
G11 - INFORMATION STORAGE
Information
Patent Application
Semiconductor wiring substrate, semiconductor device, method for te...
Publication number
20040197941
Publication date
Oct 7, 2004
Matsushita Electric Industrial Co., Ltd.
Sadami Takeoka
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor wiring substrate, semiconductor device, method for te...
Publication number
20040199840
Publication date
Oct 7, 2004
Matsushita Electric Industrial Co., Ltd.
Sadami Takeoka
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor wiring substrate, semiconductor device, method for te...
Publication number
20040195672
Publication date
Oct 7, 2004
Matsushita Electric Industrial Co., Ltd.
Sadami Takeoka
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor integrated circuit and memory test method
Publication number
20040044492
Publication date
Mar 4, 2004
Osamu Ichikawa
G11 - INFORMATION STORAGE
Information
Patent Application
Semiconductor wiring substrate, semiconductor device, method for te...
Publication number
20030025191
Publication date
Feb 6, 2003
Sadami Takeoka
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor integrated circuit and testing method for the same
Publication number
20030021464
Publication date
Jan 30, 2003
Sadami Takeoka
G01 - MEASURING TESTING