Osamu Inoue

Person

Kodaira, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Overlay error measuring device and computer program for causing com...
- Patent number 10,545,017
- Issue date Jan 28, 2020
- Hitachi High-Technologies Corporation
- Satoru Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement system and measurement method
- Patent number 10,002,743
- Issue date Jun 19, 2018
- Hitachi High-Technologies Corporation
- Shoji Hotta
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Charged particle beam device and inspection device
- Patent number 9,824,938
- Issue date Nov 21, 2017
- Hitachi High-Technologies Corporation
- Atsuko Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image processing device, charged particle beam device, charged part...
- Patent number 9,702,695
- Issue date Jul 11, 2017
- Hitachi High-Technologies Corporation
- Hiroki Kawada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing apparatus, distortion-corrected map creation appar...
- Patent number 9,514,528
- Issue date Dec 6, 2016
- Hitachi High-Technologies Corporation
- Junichi Taguchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor package, semiconductor package manufacturing method a...
- Patent number 8,823,187
- Issue date Sep 2, 2014
- Shinko Electric Industries Co., Ltd.
- Noriyoshi Shimizu
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Standard member for calibration and method of manufacturing the sam...
- Patent number 8,735,816
- Issue date May 27, 2014
- Hitachi High-Technologies Corporation
- Yoshinori Nakayama
- B32 - LAYERED PRODUCTS
Information Patent Grant
Method of manufacturing electronic component built-in substrate
- Patent number 8,116,066
- Issue date Feb 14, 2012
- Shinko Electric Industries Co., Ltd.
- Osamu Inoue
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Semiconductor device
- Patent number 7,459,786
- Issue date Dec 2, 2008
- Renesas Technology Corp.
- Hiromi Shimazu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic recording medium
- Patent number 6,852,404
- Issue date Feb 8, 2005
- TDK Corporation
- Takayoshi Kuwajima
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic recording medium
- Patent number 5,783,296
- Issue date Jul 21, 1998
- TDK Corporation
- Kazunori Tamazaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic recording medium
- Patent number 5,443,913
- Issue date Aug 22, 1995
- TDK Corporation
- Masahide Kohno
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT SYSTEM AND MEASUREMENT METHOD
- Publication number 20170047197
- Publication date Feb 16, 2017
- Hitachi High-Technologies Corporation
- Shoji HOTTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND INSPECTION DEVICE
- Publication number 20170040230
- Publication date Feb 9, 2017
- Hitachi High-Technologies Corporation
- Atsuko Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OVERLAY ERROR MEASURING DEVICE AND COMPUTER PROGRAM FOR CAUSING COM...
- Publication number 20150285627
- Publication date Oct 8, 2015
- Hitachi High-Technologies Corporation
- Satoru Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PROCESSING APPARATUS, DISTORTION-CORRECTED MAP CREATION APPAR...
- Publication number 20140341461
- Publication date Nov 20, 2014
- Hitachi, High-Technologies Corporation
- Junichi Taguchi
- G01 - MEASURING TESTING
Information Patent Application
STANDARD MEMBER FOR CALIBRATION AND METHOD OF MANUFACTURING THE SAM...
- Publication number 20130299699
- Publication date Nov 14, 2013
- Yoshinori Nakayama
- B32 - LAYERED PRODUCTS
Information Patent Application
Image Processing Device, Charged Particle Beam Device, Charged Part...
- Publication number 20130146763
- Publication date Jun 13, 2013
- Hitachi High-Technologies Corporation
- Hiroki Kawada
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR PACKAGE, SEMICONDUCTOR PACKAGE MANUFACTURING METHOD A...
- Publication number 20130119562
- Publication date May 16, 2013
- Shinko Electric Industries Co., LTD.
- Noriyoshi Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAPACITOR COMPONENT, METHOD OF MANUFACTURING THE SAME AND SEMICONDU...
- Publication number 20090273884
- Publication date Nov 5, 2009
- Shinko Electric Industries Co., Ltd.
- Noriyoshi Shimizu
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD OF MANUFACTURING ELECTRONIC COMPONENT BUILT-IN SUBSTRATE
- Publication number 20090215231
- Publication date Aug 27, 2009
- Shinko Electric Industries Co., Ltd.
- Osamu INOUE
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
HEAD APPARATUS, DRIVE APPARATUS, AND TRACKING METHOD
- Publication number 20090128949
- Publication date May 21, 2009
- TDK Corporation
- Koji MATSUNO
- G11 - INFORMATION STORAGE
Information Patent Application
BURST INTERVAL MEASURING APPARATUS, BURST INTERVAL MEASURING METHOD...
- Publication number 20090109563
- Publication date Apr 30, 2009
- TDK Corporation
- Takashi HANDA
- G11 - INFORMATION STORAGE
Information Patent Application
MAGNETIC RECORDING MEDIUM AND PROCESS FOR PRODUCING THE SAME
- Publication number 20080241602
- Publication date Oct 2, 2008
- TDK Corporation
- Hiroyuki Tanaka
- G11 - INFORMATION STORAGE
Information Patent Application
MAGNETIC RECORDING MEDIUM AND PROCESS FOR PRODUCING THE SAME
- Publication number 20080241600
- Publication date Oct 2, 2008
- TDK Corporation
- Hiroyuki Tanaka
- G11 - INFORMATION STORAGE
Information Patent Application
SERVO PATTERN RECORDING DEVICE
- Publication number 20080239565
- Publication date Oct 2, 2008
- TDK Corporation
- Osamu INOUE
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device
- Publication number 20060006543
- Publication date Jan 12, 2006
- Hitachi, Ltd
- Hiromi Shimazu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Magnetic recording medium
- Publication number 20040110033
- Publication date Jun 10, 2004
- TDK Corporation
- Takayoshi Kuwajima
- G11 - INFORMATION STORAGE

Osamu Inoue

Person

Patents Grantslast 30 patents

Overlay error measuring device and computer program for causing com...

Measurement system and measurement method

Charged particle beam device and inspection device

Image processing device, charged particle beam device, charged part...

Image processing apparatus, distortion-corrected map creation appar...

Semiconductor package, semiconductor package manufacturing method a...

Standard member for calibration and method of manufacturing the sam...

Method of manufacturing electronic component built-in substrate

Semiconductor device

Magnetic recording medium

Magnetic recording medium

Magnetic recording medium

Patents Applicationslast 30 patents

MEASUREMENT SYSTEM AND MEASUREMENT METHOD

CHARGED PARTICLE BEAM DEVICE AND INSPECTION DEVICE

OVERLAY ERROR MEASURING DEVICE AND COMPUTER PROGRAM FOR CAUSING COM...

IMAGE PROCESSING APPARATUS, DISTORTION-CORRECTED MAP CREATION APPAR...

STANDARD MEMBER FOR CALIBRATION AND METHOD OF MANUFACTURING THE SAM...

Image Processing Device, Charged Particle Beam Device, Charged Part...

SEMICONDUCTOR PACKAGE, SEMICONDUCTOR PACKAGE MANUFACTURING METHOD A...

CAPACITOR COMPONENT, METHOD OF MANUFACTURING THE SAME AND SEMICONDU...

METHOD OF MANUFACTURING ELECTRONIC COMPONENT BUILT-IN SUBSTRATE

HEAD APPARATUS, DRIVE APPARATUS, AND TRACKING METHOD

BURST INTERVAL MEASURING APPARATUS, BURST INTERVAL MEASURING METHOD...

MAGNETIC RECORDING MEDIUM AND PROCESS FOR PRODUCING THE SAME

MAGNETIC RECORDING MEDIUM AND PROCESS FOR PRODUCING THE SAME

SERVO PATTERN RECORDING DEVICE

Semiconductor device

Magnetic recording medium