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Osamu Kawatoko
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Kanagawa, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Rotary encoder
Patent number
11,422,009
Issue date
Aug 23, 2022
Mitutoyo Corporation
Osamu Kawatoko
G01 - MEASURING TESTING
Information
Patent Grant
Encoder and detection head of encoder
Patent number
11,340,095
Issue date
May 24, 2022
Mitutoyo Corporation
Osamu Kawatoko
G01 - MEASURING TESTING
Information
Patent Grant
Encoder and signal processing circuit
Patent number
11,137,269
Issue date
Oct 5, 2021
Mitutoyo Corporation
Osamu Kawatoko
G01 - MEASURING TESTING
Information
Patent Grant
Encoder and light source of encoder
Patent number
10,551,224
Issue date
Feb 4, 2020
Mitutoyo Corporation
Hirokazu Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Displacement detector
Patent number
10,520,336
Issue date
Dec 31, 2019
Mitutoyo Corporation
Osamu Kawatoko
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor integrated circuit and position detector
Patent number
9,739,587
Issue date
Aug 22, 2017
Mitutoyo Corporation
Osamu Kawatoko
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Photoelectric absolute encoder having a light receiving element arr...
Patent number
9,121,734
Issue date
Sep 1, 2015
Mitutoyo Corporation
Osamu Kawatoko
G01 - MEASURING TESTING
Information
Patent Grant
Inductive detection encoder and digital micrometer
Patent number
8,878,523
Issue date
Nov 4, 2014
Mitutoyo Corporation
Hirokazu Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Electromagnetic induction type absolute position measuring encoder
Patent number
8,847,583
Issue date
Sep 30, 2014
Mitutoyo Corporation
Kouji Sasaki
G01 - MEASURING TESTING
Information
Patent Grant
Measuring apparatus having charge control circuit
Patent number
8,441,253
Issue date
May 14, 2013
Mitutoyo Corporation
Osamu Kawatoko
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Electromagnetic induction type encoder
Patent number
7,906,958
Issue date
Mar 15, 2011
Mitutoyo Corporation
Kenichi Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Induction type displacement detector
Patent number
7,196,510
Issue date
Mar 27, 2007
Mitutoyo Corporation
Osamu Kawatoko
G01 - MEASURING TESTING
Information
Patent Grant
Electrostatic capacitance probe device and displacement measuring c...
Patent number
6,538,458
Issue date
Mar 25, 2003
Mitutoyo Corporation
Michihiko Togashi
G01 - MEASURING TESTING
Information
Patent Grant
Energy saving capacitance type measuring device for absolute measur...
Patent number
5,440,501
Issue date
Aug 8, 1995
Mitutoyo Corporation
Toshitaka Shimomura
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ROTARY ENCODER
Publication number
20210215511
Publication date
Jul 15, 2021
Mitutoyo Corporation
Osamu KAWATOKO
G01 - MEASURING TESTING
Information
Patent Application
ENCODER AND DETECTION HEAD OF ENCODER
Publication number
20210131831
Publication date
May 6, 2021
Mitutoyo Corporation
Osamu Kawatoko
G01 - MEASURING TESTING
Information
Patent Application
DISPLACEMENT DETECTOR
Publication number
20180216971
Publication date
Aug 2, 2018
Mitutoyo Corporation
Osamu Kawatoko
G01 - MEASURING TESTING
Information
Patent Application
ENCODER AND LIGHT SOURCE OF ENCODER
Publication number
20180156640
Publication date
Jun 7, 2018
MITUTOYO CORPORATION
Hirokazu KOBAYASHI
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
ENCODER AND SIGNAL PROCESSING CIRCUIT
Publication number
20180143040
Publication date
May 24, 2018
MITUTOYO CORPORATION
Osamu KAWATOKO
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND POSITION DETECTOR
Publication number
20150369580
Publication date
Dec 24, 2015
Mitutoyo Corporation
Osamu Kawatoko
G01 - MEASURING TESTING
Information
Patent Application
PHOTOELECTRIC ABSOLUTE ENCODER AND INSTALLATION METHOD THEREFOR
Publication number
20140151539
Publication date
Jun 5, 2014
Mitutoyo Corporation
Osamu Kawatoko
G01 - MEASURING TESTING
Information
Patent Application
INDUCTIVE DETECTION ENCODER AND DIGITAL MICROMETER
Publication number
20130069637
Publication date
Mar 21, 2013
Mitutoyo Corporation
Hirokazu Kobayashi
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMAGNETIC INDUCTION TYPE ABSOLUTE POSITION MEASURING ENCODER
Publication number
20130033257
Publication date
Feb 7, 2013
Mitutoyo Corporation
Kouji Sasaki
G01 - MEASURING TESTING
Information
Patent Application
MEASURING APPARATUS
Publication number
20120049840
Publication date
Mar 1, 2012
Mitutoyo Corporation
Osamu KAWATOKO
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
OPTICAL ENCODER
Publication number
20110266424
Publication date
Nov 3, 2011
MITUTOYO CORPORATION
Osamu KAWATOKO
G01 - MEASURING TESTING
Information
Patent Application
Electromagnetic induction type encoder
Publication number
20090195241
Publication date
Aug 6, 2009
MITUTOYO CORPORATIOIN
Kenichi Nakayama
G01 - MEASURING TESTING
Information
Patent Application
Caliper gauge
Publication number
20080052942
Publication date
Mar 6, 2008
Mitutoyo Corporation
Osamu Kawatoko
G01 - MEASURING TESTING
Information
Patent Application
Induction type displacement detector
Publication number
20060076949
Publication date
Apr 13, 2006
Mitutoyo Corporation
Osamu Kawatoko
G01 - MEASURING TESTING
Information
Patent Application
Electrostatic capacitance probe device and displacement measuring c...
Publication number
20020011850
Publication date
Jan 31, 2002
Michihiko Togashi
G01 - MEASURING TESTING