Osamu MORIYAMA

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device having a plurality of chips being stacked
- Patent number 10,593,645
- Issue date Mar 17, 2020
- Fujitsu Limited
- Takahiro Shikibu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test circuit and method for controlling test circuit
- Patent number 9,835,685
- Issue date Dec 5, 2017
- Fujitsu Limited
- Gen Oshiyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit and method of controlling test circuit
- Patent number 9,797,949
- Issue date Oct 24, 2017
- Fujitsu Limited
- Gen Oshiyama
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method of testing semiconductor device
- Patent number 9,746,878
- Issue date Aug 29, 2017
- Fujitsu Limited
- Gen Oshiyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data dependency managing apparatus, design data dependency managing...
- Patent number 8,566,758
- Issue date Oct 22, 2013
- Fujitsu Limited
- Osamu Moriyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for generating current source noise model for...
- Patent number 7,856,608
- Issue date Dec 21, 2010
- Fujitsu Limited
- Osamu Moriyama
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20170033085
- Publication date Feb 2, 2017
- Fujitsu Limited
- Takahiro Shikibu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST CIRCUIT AND METHOD OF CONTROLLING TEST CIRCUIT
- Publication number 20160187421
- Publication date Jun 30, 2016
- Fujitsu Limited
- Gen OSHIYAMA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF TESTING SEMICONDUCTOR DEVICE
- Publication number 20160154049
- Publication date Jun 2, 2016
- Fujitsu Limited
- Gen OSHIYAMA
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT AND METHOD FOR CONTROLLING TEST CIRCUIT
- Publication number 20160154057
- Publication date Jun 2, 2016
- Fujitsu Limited
- Gen OSHIYAMA
- G01 - MEASURING TESTING
Information Patent Application
MODEL GENERATION METHOD AND MODEL GENERATION APPARATUS OF SEMICONDU...
- Publication number 20080244478
- Publication date Oct 2, 2008
- Fujitsu Limited
- Osamu MORIYAMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DESIGN DATA DEPENDENCY MANAGING APPARATUS, DESIGN DATA DEPENDENCY M...
- Publication number 20080104565
- Publication date May 1, 2008
- FUJITSU LIMITED
- Osamu MORIYAMA
- G06 - COMPUTING CALCULATING COUNTING