Osamu Nishikawa

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Ishikawa-gun, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scanning atom probe
- Patent number 6,797,952
- Issue date Sep 28, 2004
- SII NanoTechnology Inc.
- Takashi Kaito
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Scanning atom probe and analysis method utilizing scanning atom probe
- Publication number 20030154773
- Publication date Aug 21, 2003
- Osamu Nishikawa
- G01 - MEASURING TESTING
Information Patent Application
Scanning atom probe
- Publication number 20030066962
- Publication date Apr 10, 2003
- Takashi Kaito
- B82 - NANO-TECHNOLOGY