Osamu Nishikawa

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Kanazawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scanning atom probe and analysis method utilizing scanning atom probe
- Patent number 6,875,981
- Issue date Apr 5, 2005
- Kanazawa Institute of Technology
- Osamu Nishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Optical pumping field emission type light-to-current converter
- Patent number 6,298,179
- Issue date Oct 2, 2001
- Seiko Instruments Inc.
- Osamu Nishikawa
- H01 - BASIC ELECTRIC ELEMENTS