Osamu Wakimoto

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Charged-particle beam system
- Patent number 7,329,881
- Issue date Feb 12, 2008
- Jeol Ltd.
- Osamu Wakimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lithographic method using variable-area electron-beam lithography m...
- Patent number 6,753,540
- Issue date Jun 22, 2004
- Jeol Ltd.
- Osamu Wakimoto
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Charged-particle beam system
- Publication number 20050211681
- Publication date Sep 29, 2005
- JEOL Ltd.
- Osamu Wakimoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Lithographic method using variable-area electron-beam lithography m...
- Publication number 20030107008
- Publication date Jun 12, 2003
- JEOL Ltd.
- Osamu Wakimoto
- B82 - NANO-TECHNOLOGY