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Osamu Yamada
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Katsuta, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Stage drive device
Patent number
8,638,026
Issue date
Jan 28, 2014
Hitachi High-Technologies Corporation
Masashi Shibahara
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Defective product inspection apparatus, probe positioning method an...
Patent number
8,074,293
Issue date
Dec 6, 2011
Hitachi High-Technologies Corporation
Eiichi Hazaki
G01 - MEASURING TESTING
Information
Patent Grant
Defective product inspection apparatus, probe positioning method an...
Patent number
7,553,334
Issue date
Jun 30, 2009
Hitachi High-Technologies Corporation
Eiichi Hazaki
G01 - MEASURING TESTING
Information
Patent Grant
Defective product inspection apparatus, probe positioning method an...
Patent number
7,297,945
Issue date
Nov 20, 2007
Hitachi High-Technologies Corporation
Eiichi Hazaki
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspecting apparatus
Patent number
7,129,727
Issue date
Oct 31, 2006
Hitachi High-Technologies Corporation
Tsutomu Saito
G01 - MEASURING TESTING
Information
Patent Grant
Scanning electron microscope
Patent number
6,872,944
Issue date
Mar 29, 2005
Hitachi, Ltd.
Hideo Todokoro
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning electron microscope
Patent number
6,667,476
Issue date
Dec 23, 2003
Hitachi, Ltd.
Hideo Todokoro
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam scanning type automatic inspecting apparatus
Patent number
6,580,075
Issue date
Jun 17, 2003
Hitachi, Ltd.
Masatsugu Kametani
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam scanning type automatic inspecting apparatus
Patent number
6,538,248
Issue date
Mar 25, 2003
Hitachi, Ltd.
Masatsugu Kametani
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning microscope
Patent number
5,929,439
Issue date
Jul 27, 1999
Hitachi, Ltd.
Hideo Todokoro
G02 - OPTICS
Information
Patent Grant
Charged particle beam apparatus and it's operating method
Patent number
5,393,977
Issue date
Feb 28, 1995
Hitachi, Ltd.
Akimitsu Okura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning microscope and a method of operating such a scanning micro...
Patent number
5,276,325
Issue date
Jan 4, 1994
Hitachi, Ltd.
Hideo Todokoro
G02 - OPTICS
Information
Patent Grant
Scanning tunnel microscope equipped with scanning electron microscope
Patent number
5,256,876
Issue date
Oct 26, 1993
Hitachi Ltd.
Eiichi Hazaki
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Combined scanning electron and scanning tunnelling microscope appar...
Patent number
5,081,353
Issue date
Jan 14, 1992
Hitachi, Ltd.
Osamu Yamada
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Drive apparatus for specimen stage of microscope
Patent number
4,814,682
Issue date
Mar 21, 1989
Hitachi, Ltd.
Osamu Yamada
G05 - CONTROLLING REGULATING
Information
Patent Grant
Stroboscopic type potential measurement device
Patent number
4,774,460
Issue date
Sep 27, 1988
Hitachi, Ltd.
Hideo Todokoro
G01 - MEASURING TESTING
Information
Patent Grant
Specimen image display apparatus
Patent number
4,385,317
Issue date
May 24, 1983
Hitachi, Ltd.
Toshihiro Furuya
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
STAGE DRIVE DEVICE
Publication number
20110260558
Publication date
Oct 27, 2011
Masashi Shibahara
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEFECTIVE PRODUCT INSPECTION APPARATUS, PROBE POSITIONING METHOD AN...
Publication number
20090230984
Publication date
Sep 17, 2009
Hitachi High-Technologies Corporation
Eiichi Hazaki
G01 - MEASURING TESTING
Information
Patent Application
Defective product inspection apparatus, probe positioning method an...
Publication number
20080048699
Publication date
Feb 28, 2008
Hitachi High-Technologies Corporation
Eiichi Hazaki
G01 - MEASURING TESTING
Information
Patent Application
Defect inspecting apparatus
Publication number
20060087330
Publication date
Apr 27, 2006
Hitachi High-Technologies Corporation
Tsutomu Saito
G01 - MEASURING TESTING
Information
Patent Application
Defective product inspection apparatus, probe positioning method an...
Publication number
20050139781
Publication date
Jun 30, 2005
Eiichi Hazaki
G01 - MEASURING TESTING
Information
Patent Application
Scanning electron microscope
Publication number
20040089805
Publication date
May 13, 2004
Hitachi, Ltd
Hideo Todokoro
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SCANNING ELECTRON MICROSCOPE
Publication number
20030127604
Publication date
Jul 10, 2003
HIDEO TODOKORO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged particle beam scanning type automatic inspecting apparatus
Publication number
20030062479
Publication date
Apr 3, 2003
Masatsugu Kametani
H01 - BASIC ELECTRIC ELEMENTS