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Osamu Yamaguchi
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Saitama, JP
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Patents Grants
last 30 patents
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Patent Grant
Test element group (TEG) system for measurement of SOI-MOSFET witho...
Patent number
7,807,997
Issue date
Oct 5, 2010
Oki Semiconductor Co., Ltd.
Osamu Yamaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Method for fabricating semiconductor device
Patent number
7,220,638
Issue date
May 22, 2007
Oki Electric Industry Co., Ltd.
Kouichi Tani
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Lead acid storage battery
Patent number
5,075,183
Issue date
Dec 24, 1991
Shin-Kobe Electric Machinery Co., Ltd.
Osamu Yamaguchi
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
TEG system for acquiring FET capacity and method of capacity acquis...
Publication number
20080076196
Publication date
Mar 27, 2008
Oki Electric Industry Co., Ltd.
Osamu Yamaguchi
G01 - MEASURING TESTING
Information
Patent Application
Method for fabricating semiconductor device
Publication number
20050014339
Publication date
Jan 20, 2005
Kouichi Tani
H01 - BASIC ELECTRIC ELEMENTS