Osborne A. Martin III

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Maricopa, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Inspection of microelectronic devices using near-infrared light
- Patent number 10,066,927
- Issue date Sep 4, 2018
- Intel Corporation
- Liang W. Zhang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection of microelectronic devices using near-infrared light
- Patent number 9,488,595
- Issue date Nov 8, 2016
- Intel Corporation
- Liang W. Zhang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION OF MICROELECTRONIC DEVICES USING NEAR-INFRARED LIGHT
- Publication number 20160363542
- Publication date Dec 15, 2016
- Intel Corporation
- Liang W. Zhang
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION OF MICROELECTRONIC DEVICES USING NEAR-INFRARED LIGHT
- Publication number 20150276621
- Publication date Oct 1, 2015
- Liang W. Zhang
- G01 - MEASURING TESTING