Osman Sorkhabi

Follow

Person

Danville, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Optical metrology in machine learning to characterize features
- Patent number 11,921,433
- Issue date Mar 5, 2024
- Lam Research Corporation
- Ye Feng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determining tilt angle in patterned arrays of high aspect-ratio str...
- Patent number 11,181,489
- Issue date Nov 23, 2021
- Lam Research Corporation
- William Dean Thompson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL METROLOGY IN MACHINE LEARNING TO CHARACTERIZE FEATURES
- Publication number 20210035833
- Publication date Feb 4, 2021
- LAM RESEARCH CORPORATION
- Ye Feng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING TILT ANGLE IN PATTERNED ARRAYS OF HIGH ASPECT RATIO STR...
- Publication number 20200041426
- Publication date Feb 6, 2020
- LAM RESEARCH CORPORATION
- William Dean Thompson
- G01 - MEASURING TESTING