Osuk Y. Kwon

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Seoul, KR

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Patents Grantslast 30 patents

Information Patent Grant
Contour measurement system
- Patent number 5,612,786
- Issue date Mar 18, 1997
- Lockheed Missiles & Space Company, Inc.
- Edward D. Huber
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of calibrating a three-dimensional optical measurement system
- Patent number 5,557,410
- Issue date Sep 17, 1996
- Lockheed Missiles & Space Company, Inc.
- Edward D. Huber
- G06 - COMPUTING CALCULATING COUNTING