TREA

Otger Jan Luiten

Follow

Person

  • Eindhoven, NL
People

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    Tunable source of intense, narrowband, fully coherent, soft X-rays
    • Publication number 20210400796
    • Publication date Dec 23, 2021
    • Otger Jan Luiten
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    RADIATION SENSOR APPARATUS
    • Publication number 20190353521
    • Publication date Nov 21, 2019
    • ASML NETHERLANDS B.V.
    • Vadim Yevgenyevich BANINE
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    LITHOGRAPHIC METHOD
    • Publication number 20190302625
    • Publication date Oct 3, 2019
    • ASML NETHERLANDS B.V.
    • Wouter Joep ENGELEN
    • G01 - MEASURING TESTING
  • Information Patent Application

    Electron Beam Generation for Transmission Electron Microscope
    • Publication number 20180301317
    • Publication date Oct 18, 2018
    • Otger Jan Luiten
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    TIME-OF-FLIGHT CHARGED PARTICLE SPECTROSCOPY
    • Publication number 20180151329
    • Publication date May 31, 2018
    • FEI Company
    • Otger Jom Luiten
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    LITHOGRAPHIC METHOD
    • Publication number 20180081278
    • Publication date Mar 22, 2018
    • ASML NETHERLANDS B.V.
    • Andrey Alexandrovich NIKIPELOV
    • G01 - MEASURING TESTING
  • Information Patent Application

    RADIATION SENSOR APPARATUS
    • Publication number 20180058928
    • Publication date Mar 1, 2018
    • ASML NETHERLANDS B.V.
    • Vadim Yevgenyevich BANINE
    • G01 - MEASURING TESTING
  • Information Patent Application

    LITHOGRAPHIC METHOD
    • Publication number 20160147161
    • Publication date May 26, 2016
    • ASML NETHERLANDS B.V.
    • Andrey Alexandrovich NIKIPELOV
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    BEAM PULSING DEVICE FOR USE IN CHARGED-PARTICLE MICROSCOPY
    • Publication number 20140103225
    • Publication date Apr 17, 2014
    • FEI Company
    • Erik René Kieft
    • H01 - BASIC ELECTRIC ELEMENTS