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Ozkan Celik
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Cedar Park, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Integrated substrate measurement system
Patent number
12,148,647
Issue date
Nov 19, 2024
Applied Materials, Inc.
Patricia Schulze
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and apparatus for absolute and relative depth measurements...
Patent number
11,582,378
Issue date
Feb 14, 2023
Applied Materials, Inc.
Ozkan Celik
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for mask and substrate alignment
Patent number
11,189,516
Issue date
Nov 30, 2021
Applied Materials, Inc.
Greg Freeman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and apparatus for absolute and relative depth measurements...
Patent number
11,032,464
Issue date
Jun 8, 2021
Applied Materials, Inc.
Ozkan Celik
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and apparatus for absolute and relative depth measurements...
Patent number
10,498,948
Issue date
Dec 3, 2019
Applied Materials, Inc.
Ozkan Celik
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
INTEGRATED SUBSTRATE MEASUREMENT SYSTEM
Publication number
20240339347
Publication date
Oct 10, 2024
Applied Materials, Inc.
Patricia Schulze
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTEGRATED SUBSTRATE MEASUREMENT SYSTEM
Publication number
20230238266
Publication date
Jul 27, 2023
Applied Materials, Inc.
Patricia Schulze
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR MASK AND SUBSTRATE ALIGNMENT
Publication number
20220051921
Publication date
Feb 17, 2022
Applied Materials, Inc.
Greg FREEMAN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS AND APPARATUS FOR ABSOLUTE AND RELATIVE DEPTH MEASUREMENTS...
Publication number
20210295547
Publication date
Sep 23, 2021
Applied Materials, Inc.
Ozkan Celik
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR MASK AND SUBSTRATE ALIGNMENT
Publication number
20200371448
Publication date
Nov 26, 2020
Applied Materials, Inc.
Greg FREEMAN
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHODS AND APPARATUS FOR ABSOLUTE AND RELATIVE DEPTH MEASUREMENTS...
Publication number
20200068119
Publication date
Feb 27, 2020
Applied Materials, Inc.
Ozkan Celik
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHODS AND APPARATUS FOR ABSOLUTE AND RELATIVE DEPTH MEASUREMENTS...
Publication number
20190373162
Publication date
Dec 5, 2019
Applied Materials, Inc.
Ozkan Celik
G06 - COMPUTING CALCULATING COUNTING