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P. C. Jann
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Mountain View, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Method and apparatus for optical inspection of substrates
Patent number
RE37740
Issue date
Jun 11, 2002
KLA-Tencor Corporation
Curt H. Chadwick
356 - Optics: measuring and testing
Information
Patent Grant
Automatic high speed optical inspection system
Patent number
5,131,755
Issue date
Jul 21, 1992
Curt H. Chadwick
G01 - MEASURING TESTING
Information
Patent Grant
Automatic high speed optical inspection system
Patent number
5,085,517
Issue date
Feb 4, 1992
Curt H. Chadwick
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for optical inspection of substrates
Patent number
4,877,326
Issue date
Oct 31, 1989
KLA Instruments Corporation
Curt H. Chadwick
G01 - MEASURING TESTING