P. J. DeGroot

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Seattle, WA, US

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Patents Grantslast 30 patents

Information Patent Grant
Optical thickness profiler using synthetic wavelengths
- Patent number 5,159,408
- Issue date Oct 27, 1992
- Hughes Danbury Optical Systems, Inc.
- H. E. Waldenmaier
- G01 - MEASURING TESTING
Information Patent Grant
Three wavelength optical measurement apparatus and method
- Patent number 5,153,669
- Issue date Oct 6, 1992
- Hughes Danbury Optical Systems, Inc.
- P. J. DeGroot
- G01 - MEASURING TESTING