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P. Karl Scheller
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Bow, NH, US
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Patents Grants
last 30 patents
Information
Patent Grant
Systems and methods for magnetic field sensors with self-test
Patent number
11,585,868
Issue date
Feb 21, 2023
ALLEGRO MICROSYSTEMS, LLC
P. Karl Scheller
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for monitoring a level of a regulated source
Patent number
11,243,234
Issue date
Feb 8, 2022
ALLEGRO MICROSYSTEMS, LLC
Sam Tran
G01 - MEASURING TESTING
Information
Patent Grant
Diagnostic circuits and methods for sensor test circuits
Patent number
11,194,004
Issue date
Dec 7, 2021
ALLEGRO MICROSYSTEMS, LLC
P. Karl Scheller
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for monitoring a level of a regulated source
Patent number
10,837,987
Issue date
Nov 17, 2020
ALLEGRO MICROSYSTEMS, LLC
Sam Tran
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for magnetic field sensors with self-test
Patent number
10,782,363
Issue date
Sep 22, 2020
ALLEGRO MICROSYSTEMS, LLC
P. Karl Scheller
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for extending sensor integrated circuit opera...
Patent number
10,411,498
Issue date
Sep 10, 2019
ALLEGRO MICROSYSTEMS, LLC
Eric G. Shoemaker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and apparatus for monitoring a level of a regulated source
Patent number
10,209,279
Issue date
Feb 19, 2019
ALLEGRO MICROSYSTEMS, LLC
Sam Tran
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for magnetic field sensors with self-test
Patent number
9,851,416
Issue date
Dec 26, 2017
Allegro Microsystems, LLC
P. Karl Scheller
G01 - MEASURING TESTING
Information
Patent Grant
Arrangements for magnetic field sensors that act as tooth detectors
Patent number
9,810,519
Issue date
Nov 7, 2017
Allegro Microsystems, LLC
William P. Taylor
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field sensor integrated circuit with integral ferromagneti...
Patent number
9,812,588
Issue date
Nov 7, 2017
Allegro Microsystems, LLC
Ravi Vig
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Circuits and methods for modulating current in circuits comprising...
Patent number
9,523,742
Issue date
Dec 20, 2016
Allegro Microsystems, LLC
Jay M. Towne
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Methods and apparatus for supply voltage transient protection for m...
Patent number
9,520,871
Issue date
Dec 13, 2016
Allegro Microsystems, LLC
Jeff Eagen
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Integrated circuit package having a split lead frame
Patent number
9,494,660
Issue date
Nov 15, 2016
Allegro Microsystems, LLC
Paul David
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Circuits and methods for generating a threshold signal used in a mo...
Patent number
9,476,899
Issue date
Oct 25, 2016
Allegro Microsystems, LLC
Devon Fernandez
G01 - MEASURING TESTING
Information
Patent Grant
Gear tooth sensor with peak and threshold detectors
Patent number
9,329,057
Issue date
May 3, 2016
Allegro Microsystems, LLC
Andrea Foletto
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field sensors and related techniques that can communicate...
Patent number
9,222,990
Issue date
Dec 29, 2015
Allegro Microsystems, LLC
Daniel S. Dwyer
G01 - MEASURING TESTING
Information
Patent Grant
Circuits and methods for generating a self-test of a magnetic field...
Patent number
9,151,807
Issue date
Oct 6, 2015
Allegro Microsystems, LLC
Andreas P. Friedrich
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for providing an output signal indicative of a...
Patent number
9,151,771
Issue date
Oct 6, 2015
Allegro Microsystems, LLC
Ravi Vig
G01 - MEASURING TESTING
Information
Patent Grant
High accuracy differential current sensor for applications like gro...
Patent number
9,081,041
Issue date
Jul 14, 2015
Allegro Microsystems, LLC
Andreas P. Friedrich
G01 - MEASURING TESTING
Information
Patent Grant
Angle sensor with misalignment detection and correction
Patent number
9,007,054
Issue date
Apr 14, 2015
Allegro Microsystems, LLC
Andreas P. Friedrich
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for providing an output signal indicative of a...
Patent number
8,994,369
Issue date
Mar 31, 2015
Allegro Microsystems, LLC
Ravi Vig
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field sensor having multiple sensing elements and a progra...
Patent number
8,896,295
Issue date
Nov 25, 2014
Allegro Microsystems, LLC
Andreas P. Friedrich
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field sensors and related techniques that can provide a se...
Patent number
8,860,404
Issue date
Oct 14, 2014
Allegro Microsystems, LLC
Daniel S. Dwyer
G01 - MEASURING TESTING
Information
Patent Grant
Circuits and methods for generating a self-test of a magnetic field...
Patent number
8,818,749
Issue date
Aug 26, 2014
Allegro Microsystems, LLC
Andreas P. Friedrich
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field sensors and related techniques that can provide self...
Patent number
8,754,640
Issue date
Jun 17, 2014
Allegro Microsystems, LLC
Ravi Vig
G01 - MEASURING TESTING
Information
Patent Grant
Circuits and methods for generating a threshold signal used in a ma...
Patent number
8,723,512
Issue date
May 13, 2014
Allegro Microsystems, LLC
Eric Burdette
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for providing an output signal indicative of a...
Patent number
8,624,588
Issue date
Jan 7, 2014
Allegro Microsystems, LLC
Ravi Vig
G01 - MEASURING TESTING
Information
Patent Grant
Circuits and methods for generating a self-test of a magnetic field...
Patent number
8,447,556
Issue date
May 21, 2013
Allegro Microsystems, Inc.
Andreas P. Friedrich
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field detector having a variable threshold
Patent number
8,089,270
Issue date
Jan 3, 2012
Allegro Microsystems, Inc.
P. Karl Scheller
G01 - MEASURING TESTING
Information
Patent Grant
Circuits and methods for providing a magnetic field sensor with an...
Patent number
8,058,864
Issue date
Nov 15, 2011
Allegro Microsystems, Inc.
P. Karl Scheller
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DIAGNOSTIC CIRCUITS AND METHODS FOR SENSOR TEST CIRCUITS
Publication number
20210247478
Publication date
Aug 12, 2021
ALLEGRO MICROSYSTEMS, LLC
P. Karl Scheller
G01 - MEASURING TESTING
Information
Patent Application
Methods And Apparatus For Monitoring A Level Of A Regulated Source
Publication number
20210048456
Publication date
Feb 18, 2021
ALLEGRO MICROSYSTEMS, LLC
Sam Tran
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR MAGNETIC FIELD SENSORS WITH SELF-TEST
Publication number
20200379061
Publication date
Dec 3, 2020
ALLEGRO MICROSYSTEMS, LLC
P. Karl Scheller
G01 - MEASURING TESTING
Information
Patent Application
Methods And Apparatus For Monitoring A Level Of A Regulated Source
Publication number
20190128930
Publication date
May 2, 2019
ALLEGRO MICROSYSTEMS, LLC
Sam Tran
G01 - MEASURING TESTING
Information
Patent Application
Systems And Methods For Magnetic Field Sensors With Self-Test
Publication number
20180088184
Publication date
Mar 29, 2018
Allegro Microsystems, LLC
P. Karl Scheller
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHODS FOR EXTENDING SENSOR INTEGRATED CIRCUIT OPERA...
Publication number
20170117801
Publication date
Apr 27, 2017
Allegro Microsystems, LLC
Eric G. Shoemaker
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR MONITORING A LEVEL OF A REGULATED SOURCE
Publication number
20160377663
Publication date
Dec 29, 2016
Allegro Microsystems, LLC
Jay M. Towne
G01 - MEASURING TESTING
Information
Patent Application
CIRCUITS AND METHODS FOR MODULATING CURRENT IN CIRCUITS COMPRISING...
Publication number
20160313407
Publication date
Oct 27, 2016
Allegro Microsystems, LLC
Jay M. Towne
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Magnetic Field Sensors with Self-Test
Publication number
20160025820
Publication date
Jan 28, 2016
Allegro Microsystems, LLC
P. Karl Scheller
G01 - MEASURING TESTING
Information
Patent Application
Circuits and Methods for Generating a Threshold Signal Used in a Mo...
Publication number
20150061656
Publication date
Mar 5, 2015
Allegro Microsystems, LLC
Devon Fernandez
G01 - MEASURING TESTING
Information
Patent Application
Arrangements for Magnetic Field Sensors That Act as Tooth Detectors
Publication number
20150022187
Publication date
Jan 22, 2015
Allegro Microsystems, LLC
William P. Taylor
G01 - MEASURING TESTING
Information
Patent Application
Circuits and Methods for Generating a Self-Test of a Magnetic Field...
Publication number
20140312883
Publication date
Oct 23, 2014
Allegro Microsystems, LLC
Andreas P. Friedrich
G01 - MEASURING TESTING
Information
Patent Application
CIRCUITS AND METHODS FOR GENERATING A THRESHOLD SIGNAL USED IN A MA...
Publication number
20140145711
Publication date
May 29, 2014
Eric Burdette
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and Method for Providing an Output Signal Indicative of a...
Publication number
20140084903
Publication date
Mar 27, 2014
Allegro Microsystems, LLC
Ravi Vig
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and Method for Providing an Output Signal Indicative of a...
Publication number
20140084904
Publication date
Mar 27, 2014
Allegro Microsystems, LLC
Ravi Vig
G01 - MEASURING TESTING
Information
Patent Application
Magnetic Field Sensors And Related Techniques That Can Provide A Se...
Publication number
20130335068
Publication date
Dec 19, 2013
ALLEGRO MICROSYSTEMS, INC.
Daniel S. Dwyer
G01 - MEASURING TESTING
Information
Patent Application
Magnetic Field Sensors and Related Techniques That Can Provide Self...
Publication number
20130335074
Publication date
Dec 19, 2013
ALLEGRO MICROSYSTEMS, INC.
Daniel S. Dwyer
G01 - MEASURING TESTING
Information
Patent Application
Magnetic Field Sensors and Related Techniques That Can Provide Self...
Publication number
20130335069
Publication date
Dec 19, 2013
ALLEGRO MICROSYSTEMS, INC.
Ravi Vig
G01 - MEASURING TESTING
Information
Patent Application
GEAR TOOTH SENSOR WITH PEAK AND THRESHOLD DETECTORS
Publication number
20130320970
Publication date
Dec 5, 2013
ALLEGRO MICROSYSTEMS, INC.
Andrea Foletto
G01 - MEASURING TESTING
Information
Patent Application
ANGLE SENSOR WITH MISALIGNMENT DETECTION AND CORRECTION
Publication number
20130265037
Publication date
Oct 10, 2013
ALLEGRO MICROSYSTEMS, INC.
Andreas P. Friedrich
G01 - MEASURING TESTING
Information
Patent Application
HIGH ACCURACY DIFFERENTIAL CURRENT SENSOR FOR APPLICATIONS LIKE GRO...
Publication number
20130265041
Publication date
Oct 10, 2013
ALLEGRO MICROSYSTEMS, INC.
Andreas P. Friedrich
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD SENSOR HAVING MULTIPLE SENSING ELEMENTS FOR MISALIGN...
Publication number
20130265036
Publication date
Oct 10, 2013
ALLEGRO MICROSYSTEMS, INC.
Andreas P. Friedrich
G01 - MEASURING TESTING
Information
Patent Application
Magnetic Field Sensor Integrated Circuit with Integral Ferromagneti...
Publication number
20130249029
Publication date
Sep 26, 2013
Allegro Microsystems, LLC
Ravi Vig
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CIRCUIT PACKAGE HAVING A SPLIT LEAD FRAME
Publication number
20130249546
Publication date
Sep 26, 2013
Allegro Microsystems, LLC
Paul David
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR SUPPLY VOLTAGE TRANSIENT PROTECTION
Publication number
20130176012
Publication date
Jul 11, 2013
ALLEGRO MICROSYSTEMS, INC.
Jeff Eagen
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
Circuits and Methods for Generating a Self-Test of a Magnetic Field...
Publication number
20130134965
Publication date
May 30, 2013
Andreas P. Friedrich
G01 - MEASURING TESTING
Information
Patent Application
Circuits and Methods for Providing a Magnetic Field Sensor with an...
Publication number
20100264909
Publication date
Oct 21, 2010
P. Karl Scheller
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD DETECTOR HAVING A VARIABLE THRESHOLD
Publication number
20100231202
Publication date
Sep 16, 2010
P. Karl Scheller
G01 - MEASURING TESTING
Information
Patent Application
Circuits and Methods for Generating a Self-Test of a Magnetic Field...
Publication number
20100211347
Publication date
Aug 19, 2010
ALLEGRO MICROSYSTEMS, INC.
Andreas P. Friedrich
G01 - MEASURING TESTING
Information
Patent Application
DIRECTION DETECTION SENSOR
Publication number
20100181993
Publication date
Jul 22, 2010
Devon Fernandez
G01 - MEASURING TESTING