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Pablo Lopez
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Fort Collins, CO, US
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last 30 patents
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Patent Grant
Methods and systems to detect voltage changes within integrated cir...
Patent number
8,368,385
Issue date
Feb 5, 2013
Intel Corporation
Aaron M. Barton
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
METHODS AND SYTEMS TO DETECT VOLTAGE CHANGES WITHIN INTEGRATED CIRC...
Publication number
20110074398
Publication date
Mar 31, 2011
Aaron M. Barton
G01 - MEASURING TESTING