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Padma A. Satya
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Milpitas, CA, US
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last 30 patents
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Patent Application
TEST STRUCTURES AND METHODS FOR INSPECTION OF SEMICONDUCTOR INTEGRA...
Publication number
20080246030
Publication date
Oct 9, 2008
KLA-TENCOR
Akella V.S. Satya
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
MULTIPLE DIRECTIONAL SCANS OF TEST STRUCTURES ON SEMICONDUCTOR INTE...
Publication number
20080237487
Publication date
Oct 2, 2008
KLA-TENCOR
Gustavo A. Pinto
H01 - BASIC ELECTRIC ELEMENTS