Padmini Sampath

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Bangalore, IN

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Patents Grantslast 30 patents

Information Patent Grant
Partial-writes to ECC (error check code) enabled memories
- Patent number 9,003,260
- Issue date Apr 7, 2015
- Texas Instruments Incorporated
- Saya Goud Langadi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Interruptible non-destructive run-time built-in self-test for field...
- Patent number 8,799,713
- Issue date Aug 5, 2014
- Texas Instruments Incorporated
- Swathi Gangasani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuits and methods for clock malfunction detection
- Patent number 8,473,797
- Issue date Jun 25, 2013
- Texas Instruments Incorporated
- Chirag Sureshchandra Gupta
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
CIRCUITS AND METHODS FOR CLOCK MALFUNCTION DETECTION
- Publication number 20130038352
- Publication date Feb 14, 2013
- TEXAS INSTRUMENTS INCORPORATED
- CHIRAG SURESHCHANDRA GUPTA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Partial-Writes to ECC (Error Check Code) Enabled Memories
- Publication number 20130007574
- Publication date Jan 3, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Saya Goud Langadi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTERRUPTIBLE NON-DESTRUCTIVE RUN-TIME BUILT-IN SELF-TEST FOR FIELD...
- Publication number 20120226942
- Publication date Sep 6, 2012
- Texas Instruments, Incorporated
- Swathi Gangasani
- G06 - COMPUTING CALCULATING COUNTING