Padraig TIMONEY

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Malta, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Three-dimensional scatterometry for measuring dielectric thickness
- Patent number 10,508,900
- Issue date Dec 17, 2019
- GLOBALFOUNDRIES Inc.
- Padraig Timoney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Three-dimensional scatterometry for measuring dielectric thickness
- Patent number 9,903,707
- Issue date Feb 27, 2018
- GLOBALFOUNDRIES Inc.
- Padraig Timoney
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PROCESS CONTROL OF SEMICONDUCTOR FABRICATION BASED ON LINKAGE BETWE...
- Publication number 20200279783
- Publication date Sep 3, 2020
- GLOBALFOUNDRIES INC.
- PADRAIG TIMONEY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THREE-DIMENSIONAL SCATTEROMETRY FOR MEASURING DIELECTRIC THICKNESS
- Publication number 20180135967
- Publication date May 17, 2018
- GLOBALFOUNDRIES INC.
- Padraig TIMONEY
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL SCATTEROMETRY FOR MEASURING DIELECTRIC THICKNESS
- Publication number 20170082423
- Publication date Mar 23, 2017
- GLOBALFOUNDRIES INC.
- Padraig TIMONEY
- G01 - MEASURING TESTING