Paiboon Tangyunyong

Person

Bernalillo, NM, US

People

Patents Grantslast 30 patents

Information Patent Grant
Defect screening method for electronic circuits and circuit compone...
- Patent number 10,145,894
- Issue date Dec 4, 2018
- National Technology & Engineering Solutions of Sandia, LLC
- Paiboon Tangyunyong
- G01 - MEASURING TESTING
Information Patent Grant
Scanning method for screening of electronic devices
- Patent number 10,094,874
- Issue date Oct 9, 2018
- National Technology & Engineering Solutions of Sandia, LLC
- Paiboon Tangyunyong
- G01 - MEASURING TESTING
Information Patent Grant
Power spectrum analysis for defect screening in integrated circuit...
- Patent number 9,188,622
- Issue date Nov 17, 2015
- Sandia Corporation
- Paiboon Tangyunyong
- G01 - MEASURING TESTING
Information Patent Grant
System and method for floating-substrate passive voltage contrast
- Patent number 7,525,325
- Issue date Apr 28, 2009
- Sandia Corporation
- Mark W. Jenkins
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for analyzing functional failures in integrate...
- Patent number 6,549,022
- Issue date Apr 15, 2003
- Sandia Corporation
- Edward I. Cole
- G01 - MEASURING TESTING
Information Patent Grant
Data processing device test apparatus and method therefor
- Patent number 6,546,513
- Issue date Apr 8, 2003
- Advanced Micro Devices
- Richard Jacob Wilcox
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning fluorescent microthermal imaging apparatus and method
- Patent number 5,705,821
- Issue date Jan 6, 1998
- Sandia Corporation
- Daniel L. Barton
- G01 - MEASURING TESTING

Paiboon Tangyunyong

Person

Patents Grantslast 30 patents

Defect screening method for electronic circuits and circuit compone...

Scanning method for screening of electronic devices

Power spectrum analysis for defect screening in integrated circuit...

System and method for floating-substrate passive voltage contrast

Apparatus and method for analyzing functional failures in integrate...

Data processing device test apparatus and method therefor

Scanning fluorescent microthermal imaging apparatus and method