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Patents Grants
last 30 patents
Information
Patent Grant
Nanometer magnetic multilayer film for temperature sensor and manuf...
Patent number
9,484,527
Issue date
Nov 1, 2016
Institute of Physics, Chinese Academy of Sciences
Xiufeng Han
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Double tilt transmission electron microscope sample holder for in-s...
Patent number
8,569,714
Issue date
Oct 29, 2013
Beijing University of Technology
Xiaodong Han
G01 - MEASURING TESTING
Information
Patent Grant
Sensor for quantitative measurement of electromechanical properties...
Patent number
8,302,494
Issue date
Nov 6, 2012
Beijing University of Technology
Xiaodong Han
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for measuring electromechanical properties and mi...
Patent number
8,069,733
Issue date
Dec 6, 2011
Beijing University of Technology
Xiaodong Han
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
IMAGE PROCESSING METHOD AND APPARATUS, DEVICE AND STORAGE MEDIUM
Publication number
20230328159
Publication date
Oct 12, 2023
Beijing Xiaomi Mobile Software Co., Ltd.
Pan LIU
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
NANOMETER MAGNETIC MULTILAYER FILM FOR TEMPERATURE SENSOR AND MANUF...
Publication number
20160163965
Publication date
Jun 9, 2016
INSTITUTE OF PHYSICS, CHINESE ACADEMY OF SCIENCES
Xiufeng HAN
G01 - MEASURING TESTING
Information
Patent Application
Double Tilt Transmission Electron Microscope Sample Holder for In-S...
Publication number
20130105706
Publication date
May 2, 2013
BEIJING UNIVERSITY OF TECHNOLOGY
Xiaodong Han
G01 - MEASURING TESTING
Information
Patent Application
SENSOR FOR QUANTITATIVE MEASUREMENT OF ELECTROMECHANICAL PROPERTIES...
Publication number
20110107472
Publication date
May 5, 2011
BEIJING UNIVERSITY OF TECHNOLOGY
XIAODONG HAN
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR MEASURING ELECTROMECHANICAL PROPERTIES AND MI...
Publication number
20100154557
Publication date
Jun 24, 2010
BEIJING UNIVERSITY OF TECHNOLOGY
Xiaodong Han
G01 - MEASURING TESTING