Pan Liu

Follow

Person

Beijing, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Nanometer magnetic multilayer film for temperature sensor and manuf...
- Patent number 9,484,527
- Issue date Nov 1, 2016
- Institute of Physics, Chinese Academy of Sciences
- Xiufeng Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Double tilt transmission electron microscope sample holder for in-s...
- Patent number 8,569,714
- Issue date Oct 29, 2013
- Beijing University of Technology
- Xiaodong Han
- G01 - MEASURING TESTING
Information Patent Grant
Sensor for quantitative measurement of electromechanical properties...
- Patent number 8,302,494
- Issue date Nov 6, 2012
- Beijing University of Technology
- Xiaodong Han
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring electromechanical properties and mi...
- Patent number 8,069,733
- Issue date Dec 6, 2011
- Beijing University of Technology
- Xiaodong Han
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IMAGE PROCESSING METHOD AND APPARATUS, DEVICE AND STORAGE MEDIUM
- Publication number 20230328159
- Publication date Oct 12, 2023
- Beijing Xiaomi Mobile Software Co., Ltd.
- Pan LIU
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
NANOMETER MAGNETIC MULTILAYER FILM FOR TEMPERATURE SENSOR AND MANUF...
- Publication number 20160163965
- Publication date Jun 9, 2016
- INSTITUTE OF PHYSICS, CHINESE ACADEMY OF SCIENCES
- Xiufeng HAN
- G01 - MEASURING TESTING
Information Patent Application
Double Tilt Transmission Electron Microscope Sample Holder for In-S...
- Publication number 20130105706
- Publication date May 2, 2013
- BEIJING UNIVERSITY OF TECHNOLOGY
- Xiaodong Han
- G01 - MEASURING TESTING
Information Patent Application
SENSOR FOR QUANTITATIVE MEASUREMENT OF ELECTROMECHANICAL PROPERTIES...
- Publication number 20110107472
- Publication date May 5, 2011
- BEIJING UNIVERSITY OF TECHNOLOGY
- XIAODONG HAN
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING ELECTROMECHANICAL PROPERTIES AND MI...
- Publication number 20100154557
- Publication date Jun 24, 2010
- BEIJING UNIVERSITY OF TECHNOLOGY
- Xiaodong Han
- G01 - MEASURING TESTING