Pan Zhang

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Localized diagnostic testing module
- Patent number 12,220,705
- Issue date Feb 11, 2025
- Amazon Technologies, Inc.
- Jasmin B. Farshi
- G01 - MEASURING TESTING
Information Patent Grant
Methods for managing data flow in localized diagnostics testing system
- Patent number 12,162,014
- Issue date Dec 10, 2024
- Amazon Technologies, Inc.
- Jasmin B. Farshi
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Diagnostic sample collection system
- Patent number 12,090,483
- Issue date Sep 17, 2024
- Amazon Technologies, Inc.
- Jasmin B. Farshi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LOCALIZED DIAGNOSTIC TESTING MODULE
- Publication number 20230113495
- Publication date Apr 13, 2023
- AMAZON TECHNOLOGIES, INC.
- Jasmin B. Farshi
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
DIAGNOSTIC SAMPLE COLLECTION SYSTEM
- Publication number 20230115746
- Publication date Apr 13, 2023
- AMAZON TECHNOLOGIES, INC.
- Jasmin B. Farshi
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
METHODS FOR MANAGING DATA FLOW IN LOCALIZED DIAGNOSTICS TESTING SYSTEM
- Publication number 20230112431
- Publication date Apr 13, 2023
- AMAZON TECHNOLOGIES, INC.
- Jasmin B. Farshi
- G01 - MEASURING TESTING