Pao Meng Lee

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Melaka, MY

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Patents Grantslast 30 patents

Information Patent Grant
Three dimensional lead inspection system
- Patent number 6,567,161
- Issue date May 20, 2003
- ASTI Holdings Limited
- Pao Meng Lee
- G01 - MEASURING TESTING
Information Patent Grant
Three dimensional lead inspection system
- Patent number 6,445,518
- Issue date Sep 3, 2002
- Semiconductor Technologies & Instruments, Inc.
- Pao Meng Lee
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR