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Paohuei Lee
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Fremont, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Sensors for dynamically detecting substrate breakage and misalignme...
Patent number
7,834,994
Issue date
Nov 16, 2010
Applied Materials, Inc.
William A. Bagley
G01 - MEASURING TESTING
Information
Patent Grant
Electronic device manufacturing component with an embedded chip and...
Patent number
7,587,812
Issue date
Sep 15, 2009
Applied Materials, Inc.
William Allan Bagley
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sensors for dynamically detecting substrate breakage and misalignme...
Patent number
7,440,091
Issue date
Oct 21, 2008
Applied Materials, Inc.
William A. Bagley
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SENSORS FOR DYNAMICALLY DETECTING SUBSTRATE BREAKAGE AND MISALIGNME...
Publication number
20090050270
Publication date
Feb 26, 2009
William A. Bagley
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE MANUFACTURING COMPONENT WITH AN EMBEDDED CHIP AND...
Publication number
20070197062
Publication date
Aug 23, 2007
APPLIED MATERIALS, INC.
William Allan Bagley
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Sensors for dynamically detecting substrate breakage and misalignme...
Publication number
20060087647
Publication date
Apr 27, 2006
William A. Bagley
G01 - MEASURING TESTING