Parag Birmiwal

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Voltage indicator signal generation system and method
- Patent number 8,131,906
- Issue date Mar 6, 2012
- International Business Machines Corporation
- Parag Birmiwal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Voltage indicator signal generation system and method
- Patent number 8,095,720
- Issue date Jan 10, 2012
- International Business Machines Corporation
- Parag Birmiwal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Voltage indicator signal generation system and method
- Patent number 7,934,042
- Issue date Apr 26, 2011
- International Business Machines Corporation
- Parag Birmiwal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Importation of virtual signals into electronic test equipment to fa...
- Patent number 7,915,884
- Issue date Mar 29, 2011
- International Business Machines Corporation
- Parag Birmiwal
- G01 - MEASURING TESTING
Information Patent Grant
Performing temporal checking
- Patent number 7,853,420
- Issue date Dec 14, 2010
- International Business Machines Corporation
- Parag Birmiwal
- G01 - MEASURING TESTING
Information Patent Grant
System and method for reducing test time for loading and executing...
- Patent number 7,512,925
- Issue date Mar 31, 2009
- International Business Machines Corporation
- Parag Birmiwal
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for performing temporal checking
- Patent number 7,464,354
- Issue date Dec 9, 2008
- International Business Machines Corporation
- Parag Birmiwal
- G01 - MEASURING TESTING
Information Patent Grant
Importation of virtual signals into electronic test equipment to fa...
- Patent number 7,408,336
- Issue date Aug 5, 2008
- International Business Machines Corporation
- Parag Birmiwal
- G01 - MEASURING TESTING
Information Patent Grant
Scan verification for a scan-chain device under test
- Patent number 7,386,775
- Issue date Jun 10, 2008
- International Business Machines Corporation
- Parag Birmiwal
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
VOLTAGE INDICATOR SIGNAL GENERATION SYSTEM AND METHOD
- Publication number 20110107000
- Publication date May 5, 2011
- International Business Machines Corporation
- Parag Birmiwal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VOLTAGE INDICATOR SIGNAL GENERATION SYSTEM AND METHOD
- Publication number 20110074386
- Publication date Mar 31, 2011
- International Business Machines Corporation
- Parag Birmiwal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMPORTATION OF VIRTUAL SIGNALS INTO ELECTRONIC TEST EQUIPMENT TO FA...
- Publication number 20090024346
- Publication date Jan 22, 2009
- International Business Machines Corporation
- Parag Birmiwal
- G01 - MEASURING TESTING
Information Patent Application
Performing Temporal Checking
- Publication number 20080195339
- Publication date Aug 14, 2008
- Parag Birmiwal
- G01 - MEASURING TESTING
Information Patent Application
Performing temporal checking
- Publication number 20080195340
- Publication date Aug 14, 2008
- Parag Birmiwal
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Reducing Test Time for Loading and Executing...
- Publication number 20080034261
- Publication date Feb 7, 2008
- Parag Birmiwal
- G01 - MEASURING TESTING
Information Patent Application
Method and system for generating checkpoints of hardware descriptio...
- Publication number 20070220338
- Publication date Sep 20, 2007
- International Business Machines Corporation
- Parag Birmiwal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for performing temporal checking
- Publication number 20070136703
- Publication date Jun 14, 2007
- International Business Machines Corporation
- Parag Birmiwal
- G01 - MEASURING TESTING
Information Patent Application
Importation of virtual signals into electronic test equipment to fa...
- Publication number 20070093999
- Publication date Apr 26, 2007
- International Business Machines Corporation
- Parag Birmiwal
- G01 - MEASURING TESTING
Information Patent Application
Scan verification for a device under test
- Publication number 20070061644
- Publication date Mar 15, 2007
- International Business Machines Corporation
- Parag Birmiwal
- G01 - MEASURING TESTING
Information Patent Application
Voltage indicator signal generation system and method
- Publication number 20060085586
- Publication date Apr 20, 2006
- International Business Machines Corporation
- Parag Birmiwal
- G06 - COMPUTING CALCULATING COUNTING

Parag Birmiwal

Person

Patents Grantslast 30 patents

Voltage indicator signal generation system and method

Voltage indicator signal generation system and method

Voltage indicator signal generation system and method

Importation of virtual signals into electronic test equipment to fa...

Performing temporal checking

System and method for reducing test time for loading and executing...

Method and apparatus for performing temporal checking

Importation of virtual signals into electronic test equipment to fa...

Scan verification for a scan-chain device under test

Patents Applicationslast 30 patents

VOLTAGE INDICATOR SIGNAL GENERATION SYSTEM AND METHOD

VOLTAGE INDICATOR SIGNAL GENERATION SYSTEM AND METHOD

IMPORTATION OF VIRTUAL SIGNALS INTO ELECTRONIC TEST EQUIPMENT TO FA...

Performing Temporal Checking

Performing temporal checking

System and Method for Reducing Test Time for Loading and Executing...

Method and system for generating checkpoints of hardware descriptio...

Method and apparatus for performing temporal checking

Importation of virtual signals into electronic test equipment to fa...

Scan verification for a device under test

Voltage indicator signal generation system and method