Parag Madhani

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Allentown, PA, US

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Patents Grantslast 30 patents

Information Patent Grant
Instruction address encoding and decoding based on program construc...
- Patent number 9,348,593
- Issue date May 24, 2016
- Avago Technologies General IP (Singapore) Pte. Ltd.
- Prakash Krishnamoorthy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit comprising scan test circuitry with parallel reo...
- Patent number 8,793,546
- Issue date Jul 29, 2014
- LSI Corporation
- Ramesh C. Tekumalla
- G01 - MEASURING TESTING
Information Patent Grant
Coding circuitry for difference-based data transformation
- Patent number 8,711,013
- Issue date Apr 29, 2014
- LSI Corporation
- Prakash Krishnamoorthy
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Low-power and area-efficient scan cell for integrated circuit testing
- Patent number 8,566,658
- Issue date Oct 22, 2013
- LSI Corporation
- Ramesh C. Tekumalla
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for supporting a subset of multiple interface t...
- Patent number 7,709,861
- Issue date May 4, 2010
- Agere Systems Inc.
- Parag Madhani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for distributing I/O in a semiconductor device
- Patent number 7,271,485
- Issue date Sep 18, 2007
- Agere Systems Inc.
- Parag N. Madhani
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INSTRUCTION ADDRESS ENCODING AND DECODING BASED ON PROGRAM CONSTRUC...
- Publication number 20140068229
- Publication date Mar 6, 2014
- LSI Corporation
- Prakash Krishnamoorthy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCAN-BASED CAPTURE AND SHIFT OF INTERFACE FUNCTIONAL SIGNAL VALUES...
- Publication number 20130275824
- Publication date Oct 17, 2013
- LSI Corporation
- Ramesh C. Tekumalla
- G01 - MEASURING TESTING
Information Patent Application
CODING CIRCUITRY FOR DIFFERENCE-BASED DATA TRANSFORMATION
- Publication number 20130181852
- Publication date Jul 18, 2013
- LSI Corporation
- Prakash Krishnamoorthy
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
INTEGRATED CIRCUIT COMPRISING SCAN TEST CIRCUITRY WITH PARALLEL REO...
- Publication number 20120324303
- Publication date Dec 20, 2012
- Ramesh C. Tekumalla
- G01 - MEASURING TESTING
Information Patent Application
LOW-POWER AND AREA-EFFICIENT SCAN CELL FOR INTEGRATED CIRCUIT TESTING
- Publication number 20120246529
- Publication date Sep 27, 2012
- Ramesh C. Tekumalla
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DISTRIBUTING IO IN A SEMICONDUCTOR DEVICE
- Publication number 20080061319
- Publication date Mar 13, 2008
- Agere Systems Inc.
- Parag Madhani
- H01 - BASIC ELECTRIC ELEMENTS