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Partho Tapan Chaudhuri
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Pune, IN
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last 30 patents
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Patent Grant
Efficient wrapper cell design for scan testing of integrated
Patent number
8,738,978
Issue date
May 27, 2014
LSI Corporation
Ramesh C. Tekumalla
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
EFFICIENT WRAPPER CELL DESIGN FOR SCAN TESTING OF INTEGRATED CIRCUITS
Publication number
20130007547
Publication date
Jan 3, 2013
Ramesh C. Tekumalla
G01 - MEASURING TESTING