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Pascal Ortwein
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Waldkirch, DE
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Patents Grants
last 30 patents
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Patent Grant
Two-channeled measurement apparatus
Patent number
9,128,037
Issue date
Sep 8, 2015
Sick AG
Rolf Disch
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SPECTROMETER AND ANALYSIS APPARATUS
Publication number
20160363481
Publication date
Dec 15, 2016
SICK AG
Julian EDLER
G01 - MEASURING TESTING
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Patent Application
Two-Channeled Measurement Apparatus
Publication number
20140361171
Publication date
Dec 11, 2014
SICK AG
Rolf Disch
G01 - MEASURING TESTING