TREA

Pascal Silberzan

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  • Paris, FR
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Patents Grantslast 30 patents

  • Information Patent Grant

    Atomic force microscope
    • Patent number 6,862,923
    • Issue date Mar 8, 2005
    • Centre National de la Recherche Scientifique (CNRS)
    • Axel Buguin
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Atomic force microscope
    • Publication number 20030167830
    • Publication date Sep 11, 2003
    • Axel Buguin
    • G01 - MEASURING TESTING