Pat DRENNAN

Person

Gilbert, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for testing all test circuits on a wafer from...
- Patent number 12,153,087
- Issue date Nov 26, 2024
- IC ANALYTICA, LLC
- Patrick G. Drennan
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for managing power of test circuits
- Patent number 12,007,429
- Issue date Jun 11, 2024
- IC ANALYTICA, LLC
- Patrick G. Drennan
- G01 - MEASURING TESTING
Information Patent Grant
Thermal metal ground for integrated circuit resistors
- Patent number 9,930,769
- Issue date Mar 27, 2018
- QUALCOMM Incorporated
- Arpit Mittal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for proximity-aware circuit design
- Patent number 8,281,270
- Issue date Oct 2, 2012
- Solido Design Automation Inc.
- Patrick G. Drennan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Global statistical optimization, characterization, and design
- Patent number 8,024,682
- Issue date Sep 20, 2011
- Solido Design Automation Inc.
- Trent Lorne McConaghy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of tiling analog circuits that include resistors and capacitors
- Patent number 7,305,643
- Issue date Dec 4, 2007
- FREESCALE SEMICONDUCTOR, INC.
- James F. McClellan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of tiling analog circuits
- Patent number 7,305,642
- Issue date Dec 4, 2007
- FREESCALE SEMICONDUCTOR, INC.
- James F. McClellan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mismatch modeling tool
- Patent number 7,171,346
- Issue date Jan 30, 2007
- FREESCALE SEMICONDUCTOR, INC.
- Cynthia L. Recker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for improving capacitor noise and mismatch constraints in a...
- Patent number 6,880,134
- Issue date Apr 12, 2005
- FREESCALE SEMICONDUCTOR, INC.
- Patrick G. Drennan
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR SETTING A PRECISE VOLTAGE ON TEST CIRCUITS
- Publication number 20220415727
- Publication date Dec 29, 2022
- IC ANALYTICA, LLC
- Joseph S. SPECTOR
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR TESTING ALL TEST CIRCUITS ON A WAFER FROM...
- Publication number 20220413040
- Publication date Dec 29, 2022
- IC ANALYTICA, LLC
- Patrick G. DRENNAN
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR IMPLEMENTING A SCALABLE DIGITAL INFRASTRUC...
- Publication number 20220413045
- Publication date Dec 29, 2022
- IC ANALYTICA, LLC
- Richard WUNDERLICH
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MANAGING POWER OF TEST CIRCUITS
- Publication number 20220413037
- Publication date Dec 29, 2022
- IC ANALYTICA, LLC
- Patrick G. DRENNAN
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR PROBING MULTIPLE TEST CIRCUITS IN WAFER SC...
- Publication number 20220415728
- Publication date Dec 29, 2022
- IC ANALYTICA, LLC
- Patrick G. DRENNAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI POWER DOMAINS TO REDUCE OCV USING CPR INFRASTRUCTURE
- Publication number 20180173288
- Publication date Jun 21, 2018
- QUALCOMM Incorporated
- Xiongfei Meng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THERMAL METAL GROUND FOR INTEGRATED CIRCUIT RESISTORS
- Publication number 20150237709
- Publication date Aug 20, 2015
- QUALCOMM Incorporated
- Arpit Mittal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROXIMITY-AWARE CIRCUIT DESIGN METHOD
- Publication number 20110055782
- Publication date Mar 3, 2011
- SOLIDO DESIGN AUTOMATION INC.
- Patrick G. DRENNAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GLOBAL STATISTICAL OPTIMIZATION, CHARACTERIZATION, AND DESIGN
- Publication number 20090228846
- Publication date Sep 10, 2009
- SOLIDO DESIGN AUTOMATION INC.
- Trent Lorne McCONAGHY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of tiling analog circuits that include resistors and capacitors
- Publication number 20060259888
- Publication date Nov 16, 2006
- James F. McClellan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of tiling analog circuits
- Publication number 20060225011
- Publication date Oct 5, 2006
- James F. McClellan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for improving capacitor noise and mismatch constraints in a...
- Publication number 20040205679
- Publication date Oct 14, 2004
- Patrick G. Drennan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for rapid evaluation of component mismatch in...
- Publication number 20040193390
- Publication date Sep 30, 2004
- Patrick G. Drennan
- G06 - COMPUTING CALCULATING COUNTING

Pat DRENNAN

Person

Patents Grantslast 30 patents

Apparatus and method for testing all test circuits on a wafer from...

Apparatus and method for managing power of test circuits

Thermal metal ground for integrated circuit resistors

Method and system for proximity-aware circuit design

Global statistical optimization, characterization, and design

Method of tiling analog circuits that include resistors and capacitors

Method of tiling analog circuits

Mismatch modeling tool

Method for improving capacitor noise and mismatch constraints in a...

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR SETTING A PRECISE VOLTAGE ON TEST CIRCUITS

APPARATUS AND METHOD FOR TESTING ALL TEST CIRCUITS ON A WAFER FROM...

APPARATUS AND METHOD FOR IMPLEMENTING A SCALABLE DIGITAL INFRASTRUC...

APPARATUS AND METHOD FOR MANAGING POWER OF TEST CIRCUITS

APPARATUS AND METHOD FOR PROBING MULTIPLE TEST CIRCUITS IN WAFER SC...

MULTI POWER DOMAINS TO REDUCE OCV USING CPR INFRASTRUCTURE

THERMAL METAL GROUND FOR INTEGRATED CIRCUIT RESISTORS

PROXIMITY-AWARE CIRCUIT DESIGN METHOD

GLOBAL STATISTICAL OPTIMIZATION, CHARACTERIZATION, AND DESIGN

Method of tiling analog circuits that include resistors and capacitors

Method of tiling analog circuits

Method for improving capacitor noise and mismatch constraints in a...

Method and apparatus for rapid evaluation of component mismatch in...