Pat Hom

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Milpitas, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Transparent test method and scan flip-flop
- Patent number 8,122,413
- Issue date Feb 21, 2012
- Otrsotech, Limited Liability Company
- Pat Hom
- G11 - INFORMATION STORAGE
Information Patent Grant
Mutable cells for use in integrated circuits
- Patent number 7,840,927
- Issue date Nov 23, 2010
- Harold Wallace Dozier
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Module level scan testing
- Patent number 6,079,040
- Issue date Jun 20, 2000
- Chips & Technologies, Inc.
- Pat Y. Hom
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TRANSPARENT TEST METHOD AND SCAN FLIP-FLOP
- Publication number 20100169856
- Publication date Jul 1, 2010
- Pat Hom
- G01 - MEASURING TESTING