Patric Stracke

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Muenchen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method for testing semiconductor chips by means of bit masks
- Patent number 7,461,308
- Issue date Dec 2, 2008
- Infineon Technologies AG
- Jochen Kallscheuer
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing semiconductor chips using register sets
- Patent number 7,454,676
- Issue date Nov 18, 2008
- Infineon Technologies AG
- Udo Hartmann
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND TRIMMING METHOD
- Publication number 20080129371
- Publication date Jun 5, 2008
- QIMONDA AG
- Udo Hartmann
- G11 - INFORMATION STORAGE
Information Patent Application
Method for testing semiconductor chips using check bits
- Publication number 20060156108
- Publication date Jul 13, 2006
- Patric Stracke
- G01 - MEASURING TESTING
Information Patent Application
Method for testing semiconductor chips by means of bit masks
- Publication number 20060156107
- Publication date Jul 13, 2006
- Jochen Kallscheuer
- G01 - MEASURING TESTING
Information Patent Application
Method for testing semiconductor chips using register sets
- Publication number 20060156110
- Publication date Jul 13, 2006
- Udo Hartmann
- G11 - INFORMATION STORAGE