Patricia Le Coupanec

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for detecting photon emissions from transistors
- Patent number 7,439,730
- Issue date Oct 21, 2008
- DCG Systems, Inc.
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting photon emissions from transistors
- Patent number 7,323,862
- Issue date Jan 29, 2008
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
PICA system detector calibration
- Patent number 7,113,630
- Issue date Sep 26, 2006
- Credence Systems Corporation
- Girish Dajee
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting photon emissions from transistors
- Patent number 7,038,442
- Issue date May 2, 2006
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR DETECTING PHOTON EMISSIONS FROM TRANSISTORS
- Publication number 20060181268
- Publication date Aug 17, 2006
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for detecting photon emissions from transistors
- Publication number 20060108997
- Publication date May 25, 2006
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for detecting photon emissions from transistors
- Publication number 20050146321
- Publication date Jul 7, 2005
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for detecting photon emissions from transistors
- Publication number 20040041575
- Publication date Mar 4, 2004
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
PICA system detector calibration
- Publication number 20030156750
- Publication date Aug 21, 2003
- Girish Dajee
- G01 - MEASURING TESTING