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Patrick B. Cochran
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Dripping Springs, TX, US
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last 30 patents
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Patent Grant
Method for processing multiple semiconductor devices for test
Patent number
6,905,891
Issue date
Jun 14, 2005
Frrescale Semiconductor, Inc.
Gary J. Kovar
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Method for processing multiple semiconductor devices for test
Publication number
20030160315
Publication date
Aug 28, 2003
Gary J. Kovar
G01 - MEASURING TESTING