Patrick Blanckaert

Follow

Person

Boortmeerbeek, BE

People

Patents Grantslast 30 patents

Information Patent Grant
Optical scanning probe
- Patent number 9,696,146
- Issue date Jul 4, 2017
- Nikon Metrology NV
- Patrick Blanckaert
- G01 - MEASURING TESTING
Information Patent Grant
Image forming optical system, imaging apparatus, profile measuring...
- Patent number 9,205,576
- Issue date Dec 8, 2015
- Nikon Corporation
- Daisuke Kitazawa
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR MEASURING THE POSITION AND MOVEMENT OF AN OBJECT
- Publication number 20180135969
- Publication date May 17, 2018
- NIKON METROLOGY N.V.
- Geert Vandenhoudt
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SCANNING PROBE
- Publication number 20150043008
- Publication date Feb 12, 2015
- NIKON METROLOGY N.V.
- Patrick Blanckaert
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR MEASURING THE POSITION AND MOVEMENT OF AN OBJECT
- Publication number 20140043622
- Publication date Feb 13, 2014
- NIKON METROLOGY N.V.
- Geert Vandenhoudt
- G01 - MEASURING TESTING
Information Patent Application
IMAGE FORMING OPTICAL SYSTEM, IMAGING APPARATUS, PROFILE MEASURING...
- Publication number 20130202727
- Publication date Aug 8, 2013
- NIKON METROLOGY N.V.
- Daisuke KITAZAWA
- G02 - OPTICS