Patrick Elwer

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Hillsboro, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
AC testing of leakage current in integrated circuits using RC time...
- Patent number 7,348,790
- Issue date Mar 25, 2008
- Intel Corporation
- Tawfik R. Arabi
- G01 - MEASURING TESTING
Information Patent Grant
AC testing of leakage current in integrated circuits using RC time...
- Patent number 6,967,496
- Issue date Nov 22, 2005
- Intel Corporation
- Tawfik R. Arabi
- G01 - MEASURING TESTING
Information Patent Grant
AC testing of leakage current in integrated circuits using RC time...
- Patent number 6,777,970
- Issue date Aug 17, 2004
- Intel Corporation
- Tawfik R. Arabi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AC testing of leakage current in integrated circuits using RC time...
- Publication number 20060033522
- Publication date Feb 16, 2006
- Intel Corporation
- Tawfik R. Arabi
- G01 - MEASURING TESTING
Information Patent Application
AC testing of leakage current in integrated circuits using RC time...
- Publication number 20040246017
- Publication date Dec 9, 2004
- Intel Corporation
- Tawfik R. Arabi
- G01 - MEASURING TESTING
Information Patent Application
AC testing of leakage current
- Publication number 20020153914
- Publication date Oct 24, 2002
- Intel Corporation
- Tawfik R. Arabi
- G01 - MEASURING TESTING