Patrick Flynn

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Low resistance crosspoint architecture
- Patent number 11,882,774
- Issue date Jan 23, 2024
- Micron Technology, Inc.
- Rajasekhar Venigalla
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device with laterally formed memory cells
- Patent number 11,864,475
- Issue date Jan 2, 2024
- Micron Technology, Inc.
- Thomas M. Graettinger
Information Patent Grant
Low resistance crosspoint architecture
- Patent number 11,121,317
- Issue date Sep 14, 2021
- Micron Technology, Inc.
- Rajasekhar Venigalla
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods of forming single crystal silicon structures and semiconduc...
- Patent number 9,040,424
- Issue date May 26, 2015
- Micron Technology, Inc.
- Janos Fucsko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of treating semiconductor substrates, methods of forming op...
- Patent number 8,969,217
- Issue date Mar 3, 2015
- Micron Technology, Inc.
- Janos Fucsko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of treating semiconductor substrates, methods of forming op...
- Patent number 8,492,288
- Issue date Jul 23, 2013
- Micron Technology, Inc.
- Janos Fucsko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single crystal silicon structures
- Patent number 8,159,050
- Issue date Apr 17, 2012
- Micron Technology, Inc.
- Janos Fucsko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of shaping vertical single crystal silicon walls and result...
- Patent number 7,709,341
- Issue date May 4, 2010
- Micron Technology, Inc.
- Janos Fucsko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Etching processes for integrated circuit manufacturing including me...
- Patent number 6,790,786
- Issue date Sep 14, 2004
- Micron Technology, Inc.
- Paul A. Morgan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
LOW RESISTANCE CROSSPOINT ARCHITECTURE
- Publication number 20240224825
- Publication date Jul 4, 2024
- Micron Technology, Inc.
- Rajasekhar Venigalla
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE WITH LATERALLY FORMED MEMORY CELLS
- Publication number 20240196765
- Publication date Jun 13, 2024
- Micron Technology, Inc.
- Thomas M. Graettinger
Information Patent Application
MEMORY DEVICE WITH LATERALLY FORMED MEMORY CELLS
- Publication number 20220384722
- Publication date Dec 1, 2022
- Micron Technology, Inc.
- Thomas M. Graettinger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOW RESISTANCE CROSSPOINT ARCHITECTURE
- Publication number 20220069216
- Publication date Mar 3, 2022
- Micron Technology, Inc.
- Rajasekhar Venigalla
- G11 - INFORMATION STORAGE
Information Patent Application
LOW RESISTANCE CROSSPOINT ARCHITECTURE
- Publication number 20210151675
- Publication date May 20, 2021
- Micron Technology, Inc.
- Rajasekhar Venigalla
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF FORMING SINGLE CRYSTAL SILICON STRUCTURES
- Publication number 20150206761
- Publication date Jul 23, 2015
- Micron Technology, Inc.
- Janos Fucsko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RECESSED GATE MEMORY APPARATUSES AND METHODS
- Publication number 20130334594
- Publication date Dec 19, 2013
- Jerome A. Imonigie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods Of Treating Semiconductor Substrates, Methods Of Forming Op...
- Publication number 20130302995
- Publication date Nov 14, 2013
- Micron Technology, Inc.
- Janos Fucsko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF FORMING SINGLE CRYSTAL SILICON STRUCTURES AND SEMICONDUC...
- Publication number 20120168898
- Publication date Jul 5, 2012
- Micron Technology, Inc.
- Janos Fucsko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SINGLE CRYSTAL SILICON STRUCTURES
- Publication number 20100109120
- Publication date May 6, 2010
- Micron Technology, Inc.
- Janos Fucsko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods of Treating Semiconductor Substrates, Methods Of Forming Op...
- Publication number 20090305511
- Publication date Dec 10, 2009
- Janos Fucsko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods of shaping vertical single crystal silicon walls and result...
- Publication number 20070281493
- Publication date Dec 6, 2007
- Janos Fucsko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Etching processes for integrated circuit manufacturing including me...
- Publication number 20030170961
- Publication date Sep 11, 2003
- Paul A. Morgan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patrick Flynn

Person

Patents Grantslast 30 patents

Low resistance crosspoint architecture

Memory device with laterally formed memory cells

Low resistance crosspoint architecture

Methods of forming single crystal silicon structures and semiconduc...

Methods of treating semiconductor substrates, methods of forming op...

Methods of treating semiconductor substrates, methods of forming op...

Single crystal silicon structures

Methods of shaping vertical single crystal silicon walls and result...

Etching processes for integrated circuit manufacturing including me...

Patents Applicationslast 30 patents

LOW RESISTANCE CROSSPOINT ARCHITECTURE

MEMORY DEVICE WITH LATERALLY FORMED MEMORY CELLS

MEMORY DEVICE WITH LATERALLY FORMED MEMORY CELLS

LOW RESISTANCE CROSSPOINT ARCHITECTURE

LOW RESISTANCE CROSSPOINT ARCHITECTURE

METHODS OF FORMING SINGLE CRYSTAL SILICON STRUCTURES

RECESSED GATE MEMORY APPARATUSES AND METHODS

Methods Of Treating Semiconductor Substrates, Methods Of Forming Op...

METHODS OF FORMING SINGLE CRYSTAL SILICON STRUCTURES AND SEMICONDUC...

SINGLE CRYSTAL SILICON STRUCTURES

Methods of Treating Semiconductor Substrates, Methods Of Forming Op...

Methods of shaping vertical single crystal silicon walls and result...

Etching processes for integrated circuit manufacturing including me...