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Patrick H. Mawet
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Snohomish, WA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Customizable power-on reset circuit based on critical circuit count...
Patent number
7,667,506
Issue date
Feb 23, 2010
Mitutoyo Corporation
Patrick H. Mawet
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inductive transducer measurement system
Patent number
7,323,863
Issue date
Jan 29, 2008
Mitutoyo Corporation
Patrick Mawet
G01 - MEASURING TESTING
Information
Patent Grant
Fiber-optic alignment with detector IC
Patent number
7,217,041
Issue date
May 15, 2007
Mitutoyo Corporation
Joseph Daniel Tobiason
G02 - OPTICS
Information
Patent Grant
Systems and methods for high-accuracy displacement determination in...
Patent number
6,873,422
Issue date
Mar 29, 2005
Mitutoyo Corporation
Michael Nahum
G01 - MEASURING TESTING
Information
Patent Grant
Low voltage low power signal processing system and method for high...
Patent number
6,859,762
Issue date
Feb 22, 2005
Mitutoyo Corporation
Patrick H. Mawet
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Compact delay circuit for CMOS integrated circuits used in low volt...
Patent number
6,747,500
Issue date
Jun 8, 2004
Mitutoyo Corporation
Patrick H. Mawet
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
System and method for determination of error parameters for perform...
Patent number
6,487,787
Issue date
Dec 3, 2002
Mitutoyo Corporation
Michael Nahum
G01 - MEASURING TESTING
Information
Patent Grant
Method for conserving power by adjusting clock frequency based on a...
Patent number
5,948,105
Issue date
Sep 7, 1999
Mitutoyo Corporation
David Skurnik
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Open loop pre-amplifier for an electronic measuring system
Patent number
5,869,999
Issue date
Feb 9, 1999
Mitutoyo Corporation
Patrick H. Mawet
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for fast sampling in capacitive position trans...
Patent number
5,670,887
Issue date
Sep 23, 1997
Mitutoyo Corporation
Nils Ingvar Andermo
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DRIVE CIRCUIT FOR INDUCTIVE POSITION TRANSDUCER SYSTEM
Publication number
20240223141
Publication date
Jul 4, 2024
MITUTOYO CORPORATION
Patrick H. Mawet
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
CUSTOMIZABLE POWER-ON RESET CIRCUIT BASED ON CRITICAL CIRCUIT COUNT...
Publication number
20080238499
Publication date
Oct 2, 2008
Mitutoyo Corporation
Patrick H. Mawet
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Inductive transducer measurement system
Publication number
20070085530
Publication date
Apr 19, 2007
Patrick Mawet
G01 - MEASURING TESTING
Information
Patent Application
Fiber-optic alignment with detector IC
Publication number
20070071390
Publication date
Mar 29, 2007
Joseph Daniel Tobiason
G02 - OPTICS
Information
Patent Application
COMPACT DELAY CIRCUIT FOR CMOS INTEGRATED CIRCUITS USED IN LOW VOLT...
Publication number
20030076145
Publication date
Apr 24, 2003
Mitutoyo Corporation
Patrick H. Mawet
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Low voltage low power signal processing system and method for high...
Publication number
20030018452
Publication date
Jan 23, 2003
Mitutoyo Corporation
Patrick H. Mawet
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Systems and methods for high-accuracy displacement determination in...
Publication number
20020105656
Publication date
Aug 8, 2002
Mitutoyo Corporation
Michael Nahum
G01 - MEASURING TESTING