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Patrick J. Alladio
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Santa Rosa, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Electrically conductive pins for microcircuit tester
Patent number
10,877,090
Issue date
Dec 29, 2020
Johnstech International Corporation
John E. Nelson
G01 - MEASURING TESTING
Information
Patent Grant
Electrically conductive pins for microcircuit tester
Patent number
9,007,082
Issue date
Apr 14, 2015
Johnstech International Corporation
John E. Nelson
G01 - MEASURING TESTING
Information
Patent Grant
Microcircuit tester with slideable electrically conductive pins
Patent number
8,937,484
Issue date
Jan 20, 2015
Johnstech International Corporation
John E. Nelson
G01 - MEASURING TESTING
Information
Patent Grant
Test contact system for testing integrated circuits with packages h...
Patent number
8,912,811
Issue date
Dec 16, 2014
Johnstech International Corporation
Jeffrey C. Sherry
G01 - MEASURING TESTING
Information
Patent Grant
Electrically conductive pins for microcircuit tester
Patent number
8,536,889
Issue date
Sep 17, 2013
Johnstech International Corporation
John E. Nelson
G01 - MEASURING TESTING
Information
Patent Grant
Electronic device test fixture
Patent number
8,441,275
Issue date
May 14, 2013
Tapt Interconnect, LLC
Patrick J Alladio
G01 - MEASURING TESTING
Information
Patent Grant
Test contact system for testing integrated circuits with packages h...
Patent number
8,102,184
Issue date
Jan 24, 2012
Johnstech International
Jeffrey C. Sherry
G01 - MEASURING TESTING
Information
Patent Grant
Contact insert for a microcircuit test socket
Patent number
7,994,808
Issue date
Aug 9, 2011
Johnstech International Corporation
Patrick J. Alladio
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Electrically Conductive Pins For Microcircuit Tester
Publication number
20170315169
Publication date
Nov 2, 2017
Johnstech International Corporation
John E. Nelson
G01 - MEASURING TESTING
Information
Patent Application
Electrically Conductive Pins For Microcircuit Tester
Publication number
20150123689
Publication date
May 7, 2015
Johnstech International Corporation
John E. Nelson
G01 - MEASURING TESTING
Information
Patent Application
Electrically Conductive Pins For Microcircuit Tester
Publication number
20130271176
Publication date
Oct 17, 2013
John E. Nelson
G01 - MEASURING TESTING
Information
Patent Application
Electrically Conductive Pins For Microcircuit Tester
Publication number
20130154678
Publication date
Jun 20, 2013
Johnstech International Corporation
John E. Nelson
G01 - MEASURING TESTING
Information
Patent Application
Test Contact System For Testing Integrated Circuits With Packages H...
Publication number
20120176151
Publication date
Jul 12, 2012
Johnstech International Corporation
Jeffrey C. Sherry
G01 - MEASURING TESTING
Information
Patent Application
Electrically Conductive Pins For Microcircuit Tester
Publication number
20120062261
Publication date
Mar 15, 2012
Johnstech International Corporation
John E. Nelson
G01 - MEASURING TESTING
Information
Patent Application
Electrically Conductive Pins For Microcircuit Tester
Publication number
20100231251
Publication date
Sep 16, 2010
John E. Nelson
G01 - MEASURING TESTING
Information
Patent Application
Test Contact System For Testing Integrated Circuits With Packages H...
Publication number
20090302878
Publication date
Dec 10, 2009
Jeffrey C. Sherry
G01 - MEASURING TESTING
Information
Patent Application
CONTACT INSERT FOR A MICROCIRCUIT TEST SOCKET
Publication number
20080297142
Publication date
Dec 4, 2008
Patrick J. Alladio
G01 - MEASURING TESTING
Information
Patent Application
CONTACT INSERT FOR A MICROCIRCUIT TEST SOCKET
Publication number
20080218177
Publication date
Sep 11, 2008
Johns Tech International Corporation
Patrick J. Alladio
G01 - MEASURING TESTING