Patrick J. Kilps

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Hubertus, WI, US

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Patents Grantslast 30 patents

Information Patent Grant
Particulate monitor
- Patent number 8,813,583
- Issue date Aug 26, 2014
- 3M Innovative Properties Company
- Patrick J. Kilps
- G01 - MEASURING TESTING
Information Patent Grant
Noise monitor with red surface lighting
- Patent number D654386
- Issue date Feb 21, 2012
- 3M Innovative Properties Company
- Philip J. Battenberg
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Noise monitor
- Patent number D648643
- Issue date Nov 15, 2011
- 3M Innovative Properties Company
- Philip J. Battenberg
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Particulate monitor
- Patent number 7,987,695
- Issue date Aug 2, 2011
- 3M Innovative Properties Company
- Patrick J. Kilps
- G01 - MEASURING TESTING
Information Patent Grant
Noise monitor having a handle
- Patent number D631769
- Issue date Feb 1, 2011
- 3M Innovative Properties Company
- Patrick J. Kilps
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Particulate monitor
- Patent number 7,631,568
- Issue date Dec 15, 2009
- Quest Technologies
- Patrick James Kilps
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PARTICULATE MONITOR
- Publication number 20110252869
- Publication date Oct 20, 2011
- 3M Innovative Properties Company
- Patrick J. Kilps
- G01 - MEASURING TESTING
Information Patent Application
PARTICULATE MONITOR
- Publication number 20090320562
- Publication date Dec 31, 2009
- Patrick J. Kilps
- G01 - MEASURING TESTING
Information Patent Application
PARTICULATE MONITOR
- Publication number 20090056417
- Publication date Mar 5, 2009
- QUEST TECHNOLOGIES, INC.
- Patrick James Kilps
- G01 - MEASURING TESTING
Information Patent Application
Noise exposure monitoring device
- Publication number 20050244013
- Publication date Nov 3, 2005
- Quest Technologies
- Philip J. Battenberg
- G01 - MEASURING TESTING